Abstract
Electrical/dielectric properties of nanocrystalline cerium oxide have been studied using impedance spectroscopy, thermopower, and DC 4-point conductivity. The combined techniques identified the effect of poor electroding on impedance spectra. Incomplete contact between the specimen and the electrode induces an additional arc in the impedance spectra. The additional high resistance feature results from the geometric constriction of current flow at the specimen/electrode interface and can be misinterpreted as a grain boundary response. The defect chemistry, nonstoichiometry, and transport properties were investigated in nanoscale ceria and compared with those of microcrystalline material.
| Original language | English |
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| Title of host publication | Materials Research Society Symposium - Proceedings |
| Editors | E.P. George, R. Gotthardt, K. Otsuka, S. Trolier-McKinstry, M. Wun-Fogle |
| Publisher | Materials Research Society |
| Pages | 27-32 |
| Number of pages | 6 |
| Volume | 457 |
| Publication status | Published - 1997 |
| Event | Proceedings of the 1996 MRS Fall Symposium - Boston, MA, USA Duration: Dec 2 1996 → Dec 5 1996 |
Other
| Other | Proceedings of the 1996 MRS Fall Symposium |
|---|---|
| City | Boston, MA, USA |
| Period | 12/2/96 → 12/5/96 |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
Cite this
Hwang, J. H., Mason, T. O., & Garboczi, E. J. (1997). Electrical/dielectric properties of nanocrystalline cerium oxide. In E. P. George, R. Gotthardt, K. Otsuka, S. Trolier-McKinstry, & M. Wun-Fogle (Eds.), Materials Research Society Symposium - Proceedings (Vol. 457, pp. 27-32). Materials Research Society.