Electrical/dielectric properties of nanocrystalline cerium oxide

Jin Ha Hwang, Thomas O Mason, Edward J. Garboczi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Electrical/dielectric properties of nanocrystalline cerium oxide have been studied using impedance spectroscopy, thermopower, and DC 4-point conductivity. The combined techniques identified the effect of poor electroding on impedance spectra. Incomplete contact between the specimen and the electrode induces an additional arc in the impedance spectra. The additional high resistance feature results from the geometric constriction of current flow at the specimen/electrode interface and can be misinterpreted as a grain boundary response. The defect chemistry, nonstoichiometry, and transport properties were investigated in nanoscale ceria and compared with those of microcrystalline material.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsE.P. George, R. Gotthardt, K. Otsuka, S. Trolier-McKinstry, M. Wun-Fogle
PublisherMaterials Research Society
Pages27-32
Number of pages6
Volume457
Publication statusPublished - 1997
EventProceedings of the 1996 MRS Fall Symposium - Boston, MA, USA
Duration: Dec 2 1996Dec 5 1996

Other

OtherProceedings of the 1996 MRS Fall Symposium
CityBoston, MA, USA
Period12/2/9612/5/96

Fingerprint

Cerium
Dielectric properties
Electrodes
Oxides
Thermoelectric power
Cerium compounds
Transport properties
Grain boundaries
Spectroscopy
Defects
ceric oxide

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Hwang, J. H., Mason, T. O., & Garboczi, E. J. (1997). Electrical/dielectric properties of nanocrystalline cerium oxide. In E. P. George, R. Gotthardt, K. Otsuka, S. Trolier-McKinstry, & M. Wun-Fogle (Eds.), Materials Research Society Symposium - Proceedings (Vol. 457, pp. 27-32). Materials Research Society.

Electrical/dielectric properties of nanocrystalline cerium oxide. / Hwang, Jin Ha; Mason, Thomas O; Garboczi, Edward J.

Materials Research Society Symposium - Proceedings. ed. / E.P. George; R. Gotthardt; K. Otsuka; S. Trolier-McKinstry; M. Wun-Fogle. Vol. 457 Materials Research Society, 1997. p. 27-32.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hwang, JH, Mason, TO & Garboczi, EJ 1997, Electrical/dielectric properties of nanocrystalline cerium oxide. in EP George, R Gotthardt, K Otsuka, S Trolier-McKinstry & M Wun-Fogle (eds), Materials Research Society Symposium - Proceedings. vol. 457, Materials Research Society, pp. 27-32, Proceedings of the 1996 MRS Fall Symposium, Boston, MA, USA, 12/2/96.
Hwang JH, Mason TO, Garboczi EJ. Electrical/dielectric properties of nanocrystalline cerium oxide. In George EP, Gotthardt R, Otsuka K, Trolier-McKinstry S, Wun-Fogle M, editors, Materials Research Society Symposium - Proceedings. Vol. 457. Materials Research Society. 1997. p. 27-32
Hwang, Jin Ha ; Mason, Thomas O ; Garboczi, Edward J. / Electrical/dielectric properties of nanocrystalline cerium oxide. Materials Research Society Symposium - Proceedings. editor / E.P. George ; R. Gotthardt ; K. Otsuka ; S. Trolier-McKinstry ; M. Wun-Fogle. Vol. 457 Materials Research Society, 1997. pp. 27-32
@inproceedings{15281f03cbf5427790d03dc70399defe,
title = "Electrical/dielectric properties of nanocrystalline cerium oxide",
abstract = "Electrical/dielectric properties of nanocrystalline cerium oxide have been studied using impedance spectroscopy, thermopower, and DC 4-point conductivity. The combined techniques identified the effect of poor electroding on impedance spectra. Incomplete contact between the specimen and the electrode induces an additional arc in the impedance spectra. The additional high resistance feature results from the geometric constriction of current flow at the specimen/electrode interface and can be misinterpreted as a grain boundary response. The defect chemistry, nonstoichiometry, and transport properties were investigated in nanoscale ceria and compared with those of microcrystalline material.",
author = "Hwang, {Jin Ha} and Mason, {Thomas O} and Garboczi, {Edward J.}",
year = "1997",
language = "English",
volume = "457",
pages = "27--32",
editor = "E.P. George and R. Gotthardt and K. Otsuka and S. Trolier-McKinstry and M. Wun-Fogle",
booktitle = "Materials Research Society Symposium - Proceedings",
publisher = "Materials Research Society",

}

TY - GEN

T1 - Electrical/dielectric properties of nanocrystalline cerium oxide

AU - Hwang, Jin Ha

AU - Mason, Thomas O

AU - Garboczi, Edward J.

PY - 1997

Y1 - 1997

N2 - Electrical/dielectric properties of nanocrystalline cerium oxide have been studied using impedance spectroscopy, thermopower, and DC 4-point conductivity. The combined techniques identified the effect of poor electroding on impedance spectra. Incomplete contact between the specimen and the electrode induces an additional arc in the impedance spectra. The additional high resistance feature results from the geometric constriction of current flow at the specimen/electrode interface and can be misinterpreted as a grain boundary response. The defect chemistry, nonstoichiometry, and transport properties were investigated in nanoscale ceria and compared with those of microcrystalline material.

AB - Electrical/dielectric properties of nanocrystalline cerium oxide have been studied using impedance spectroscopy, thermopower, and DC 4-point conductivity. The combined techniques identified the effect of poor electroding on impedance spectra. Incomplete contact between the specimen and the electrode induces an additional arc in the impedance spectra. The additional high resistance feature results from the geometric constriction of current flow at the specimen/electrode interface and can be misinterpreted as a grain boundary response. The defect chemistry, nonstoichiometry, and transport properties were investigated in nanoscale ceria and compared with those of microcrystalline material.

UR - http://www.scopus.com/inward/record.url?scp=0030643892&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030643892&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0030643892

VL - 457

SP - 27

EP - 32

BT - Materials Research Society Symposium - Proceedings

A2 - George, E.P.

A2 - Gotthardt, R.

A2 - Otsuka, K.

A2 - Trolier-McKinstry, S.

A2 - Wun-Fogle, M.

PB - Materials Research Society

ER -