Electrical/dielectric properties of nanocrystalline cerium oxide

Jin Ha Hwang, Thomas O Mason, Edward J. Garboczi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Electrical/dielectric properties of nanocrystalline cerium oxide have been studied using impedance spectroscopy, thermopower, and DC 4-point conductivity. The combined techniques identified the effect of poor electroding on impedance spectra. Incomplete contact between the specimen and the electrode induces an additional arc in the impedance spectra. The additional high resistance feature results from the geometric constriction of current flow at the specimen/electrode interface and can be misinterpreted as a grain boundary response. The defect chemistry, nonstoichiometry, and transport properties were investigated in nanoscale ceria and compared with those of microcrystalline material.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsE.P. George, R. Gotthardt, K. Otsuka, S. Trolier-McKinstry, M. Wun-Fogle
PublisherMaterials Research Society
Pages27-32
Number of pages6
Volume457
Publication statusPublished - 1997
EventProceedings of the 1996 MRS Fall Symposium - Boston, MA, USA
Duration: Dec 2 1996Dec 5 1996

Other

OtherProceedings of the 1996 MRS Fall Symposium
CityBoston, MA, USA
Period12/2/9612/5/96

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Hwang, J. H., Mason, T. O., & Garboczi, E. J. (1997). Electrical/dielectric properties of nanocrystalline cerium oxide. In E. P. George, R. Gotthardt, K. Otsuka, S. Trolier-McKinstry, & M. Wun-Fogle (Eds.), Materials Research Society Symposium - Proceedings (Vol. 457, pp. 27-32). Materials Research Society.