Electroluminescence, photoluminescence and X-ray reflectivity studies of self-assembled ultra-thin films

Haiping Hong, Dan Davidov, Yair Avny, Haim Chayet, Erez Z. Faraggi, Ronny Neumann

Research output: Contribution to journal › Article

80 Citations (Scopus)
Original languageEnglish
Pages (from-to)846-849
Number of pages4
JournalAdvanced Materials
Volume7
Issue number10
Publication statusPublished - Oct 1995

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Electromagnetic wave reflection
Ultrathin films
Light emission
Electroluminescence
Electrolytes
Light emitting diodes
Heterojunctions
Photoluminescence
Multilayers
Copolymers
Surface roughness
X rays
Coating techniques
Spin coating
Polymer films
Self assembly
Polymers
Fabrication

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Electroluminescence, photoluminescence and X-ray reflectivity studies of self-assembled ultra-thin films. / Hong, Haiping; Davidov, Dan; Avny, Yair; Chayet, Haim; Faraggi, Erez Z.; Neumann, Ronny.

In: Advanced Materials, Vol. 7, No. 10, 10.1995, p. 846-849.

Research output: Contribution to journal › Article

Hong, H, Davidov, D, Avny, Y, Chayet, H, Faraggi, EZ & Neumann, R 1995, 'Electroluminescence, photoluminescence and X-ray reflectivity studies of self-assembled ultra-thin films', Advanced Materials, vol. 7, no. 10, pp. 846-849.
Hong H, Davidov D, Avny Y, Chayet H, Faraggi EZ, Neumann R. Electroluminescence, photoluminescence and X-ray reflectivity studies of self-assembled ultra-thin films. Advanced Materials. 1995 Oct;7(10):846-849.
Hong, Haiping ; Davidov, Dan ; Avny, Yair ; Chayet, Haim ; Faraggi, Erez Z. ; Neumann, Ronny. / Electroluminescence, photoluminescence and X-ray reflectivity studies of self-assembled ultra-thin films. In: Advanced Materials. 1995 ; Vol. 7, No. 10. pp. 846-849.
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