Electroluminescence, photoluminescence and X-ray reflectivity studies of self-assembled ultra-thin films

Haiping Hong, Dan Davidov, Yair Avny, Haim Chayet, Erez Z. Faraggi, Ronny Neumann

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Cite this

@article{988d4fc280194df7b9f818c403c97586,

title = "Electroluminescence, photoluminescence and X-ray reflectivity studies of self-assembled ultra-thin films",

author = "Haiping Hong and Dan Davidov and Yair Avny and Haim Chayet and Faraggi, {Erez Z.} and Ronny Neumann",

year = "1995",

month = oct,

language = "English",

volume = "7",

pages = "846--849",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "Wiley-VCH Verlag",

number = "10",

}

TY - JOUR

T1 - Electroluminescence, photoluminescence and X-ray reflectivity studies of self-assembled ultra-thin films

AU - Hong, Haiping

AU - Davidov, Dan

AU - Avny, Yair

AU - Chayet, Haim

AU - Faraggi, Erez Z.

AU - Neumann, Ronny

PY - 1995/10

Y1 - 1995/10

UR - http://www.scopus.com/inward/record.url?scp=0029386797&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029386797&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0029386797

VL - 7

SP - 846

EP - 849

JO - Advanced Materials

JF - Advanced Materials

SN - 0935-9648

IS - 10

ER -