Electron beam induced current imaging of ferroelectric thin films

Igor Lubomirsky, Tzu Y U Wang, Konstantin Gartsman, Oscar M. Stafsudd

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

We have observed Electron Beam Induced Current imaging of thin film ferroelectrics. The Electron beam irradiation of a thin ferroelectric film creates a local temperature gradient that induces a polarization gradient and therefore a local electric field. Although the temperature difference is small the gradient is on the order of thousands K/cm and results in a corresponding electric field of a few MV/cm. The thermally induced electric field drives the electron beam created carriers toward an electrode thus inducing an externally measurable current. Despite the very small carrier life time (

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsM.E. Hawley, D.H.A. Blank, C.-B. Eom, D.G. Schlom, S.K. Streiffer
Pages101-106
Number of pages6
Volume574
Publication statusPublished - 1999
EventProceedings of the 1999 MRS Spring Meeting - Symposium BB: 'Multicomponent Oxide Films for Electronics' - San Francisco, CA, United States
Duration: Apr 6 1999Apr 8 1999

Other

OtherProceedings of the 1999 MRS Spring Meeting - Symposium BB: 'Multicomponent Oxide Films for Electronics'
CountryUnited States
CitySan Francisco, CA
Period4/6/994/8/99

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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    Lubomirsky, I., Wang, T. Y. U., Gartsman, K., & Stafsudd, O. M. (1999). Electron beam induced current imaging of ferroelectric thin films. In M. E. Hawley, D. H. A. Blank, C-B. Eom, D. G. Schlom, & S. K. Streiffer (Eds.), Materials Research Society Symposium - Proceedings (Vol. 574, pp. 101-106)