Electronic states in La2-xSrxCuO4+ probed by soft-x-ray absorption

C. T. Chen, F. Sette, Y. Ma, M. S. Hybertsen, Ellen Stechel, W. M C Foulkes, M. Schulter, S. W. Cheong, A. S. Cooper, L. W. Rupp, B. Batlogg, Y. L. Soo, Z. H. Ming, A. Krol, Y. H. Kao

Research output: Contribution to journalArticle

392 Citations (Scopus)

Abstract

Oxygen K-edge absorption spectra of carefully characterized La2-xSrxCuO4+ samples were measured using a bulk-sensitive fluoresence-yield-detection method. They reveal two distinct pre-edge peaks which evolve systematically as a function of Sr concentration. The measured spectra are quantitatively described by calculations based on the Hubbard model, including local Coulomb interactions and core-hole excitonic correlations. The absorption data are consistent with a description of electronic states based on a doped charge-transfer insulator.

Original languageEnglish
Pages (from-to)104-107
Number of pages4
JournalPhysical Review Letters
Volume66
Issue number1
DOIs
Publication statusPublished - 1991

    Fingerprint

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Chen, C. T., Sette, F., Ma, Y., Hybertsen, M. S., Stechel, E., Foulkes, W. M. C., Schulter, M., Cheong, S. W., Cooper, A. S., Rupp, L. W., Batlogg, B., Soo, Y. L., Ming, Z. H., Krol, A., & Kao, Y. H. (1991). Electronic states in La2-xSrxCuO4+ probed by soft-x-ray absorption. Physical Review Letters, 66(1), 104-107. https://doi.org/10.1103/PhysRevLett.66.104