Abstract
Small voids are formed in Si by MeV He implantation and annealing. We measure the equilibrium shape of these voids and hence extract the surface energy curve () for Si. (111) is the global minimum, with (100)1.1(111) and all other cusps on the surface being relatively small. The experimental () is compared with theoretical predictions and earlier experiments. Step energies obtained from d/d are 2810 meV/atom on (100) and 14020 meV/atom on (111); these values are compared with scanning tunneling microscope experiments.
| Original language | English |
|---|---|
| Pages (from-to) | 1643-1646 |
| Number of pages | 4 |
| Journal | Physical review letters |
| Volume | 70 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 1993 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Eaglesham, D. J., White, A. E., Feldman, L. C., Moriya, N., & Jacobson, D. C. (1993). Equilibrium shape of Si. Physical review letters, 70(11), 1643-1646. https://doi.org/10.1103/PhysRevLett.70.1643