Abstract
This corrects the article DOI: 10.1103/PhysRevLett.113.176802.
| Original language | English |
|---|---|
| Article number | 219902 |
| Number of pages | 1 |
| Journal | Physical review letters |
| Volume | 118 |
| Issue number | 21 |
| DOIs |
|
| Publication status | Published - May 26 2017 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
Fingerprint Dive into the research topics of 'Erratum: First-Principles Approach to Calculating Energy Level Alignment at Aqueous Semiconductor Interfaces [Phys. Rev. Lett. 113, 176802 (2014)'. Together they form a unique fingerprint.
Cite this
Kharche, N., Muckerman, J. T., & Hybertsen, M. S. (2017). Erratum: First-Principles Approach to Calculating Energy Level Alignment at Aqueous Semiconductor Interfaces [Phys. Rev. Lett. 113, 176802 (2014). Physical review letters, 118(21), [219902]. https://doi.org/10.1103/PhysRevLett.118.219902