Evolution of electrical, chemical, and structural properties of transparent and conducting chemically derived craphene thin films

Cecilia Mattevi, Goki Eda, Stefano Agnoli, Steve Miller, K. Andre Mkhoyan, Ozgur Celik, Daniel Mastrogiovanni, Caetano Cranozzi, Eric Garfunkel, Manish Chhowalla

Research output: Contribution to journalArticle

1092 Citations (Scopus)

Abstract

A detailed description of the electronic properties, chemical state, and structure of uniform single and few-layered graphene oxide (CO) thin films at different stages of reduction is reported. The residual oxygen content and structure of CO are monitored and these chemical and structural characteristics are correlated to electronic properties of the thin films at various stages of reduction. It is found that the electrical characteristics of reduced GO do not approach those of intrinsic graphene obtained by mechanical cleaving because the material remains significantly oxidized. The residual oxygen forms sp 3 bonds with carbon atoms in the basal plane such that the carbon sp2 bonding fraction in fully reduced CO is ~0.80. The minority sp3 bonds disrupt the transport of carriers delocalized in the sp2 network, limiting the mobility, and conductivity of reduced CO thin films. Extrapolation of electrical conductivity data as a function of oxygen content reveals that complete removal of oxygen should lead to properties that are comparable to graphene.

Original languageEnglish
Pages (from-to)2577-2583
Number of pages7
JournalAdvanced Functional Materials
Volume19
Issue number16
DOIs
Publication statusPublished - 2009

Fingerprint

Carbon Monoxide
chemical properties
Chemical properties
Graphite
Structural properties
Electric properties
electrical properties
Graphene
Oxygen
conduction
Thin films
graphene
oxygen
thin films
Electronic properties
Carbon
carbon
minorities
electronics
Extrapolation

ASJC Scopus subject areas

  • Biomaterials
  • Electrochemistry
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Evolution of electrical, chemical, and structural properties of transparent and conducting chemically derived craphene thin films. / Mattevi, Cecilia; Eda, Goki; Agnoli, Stefano; Miller, Steve; Mkhoyan, K. Andre; Celik, Ozgur; Mastrogiovanni, Daniel; Cranozzi, Caetano; Garfunkel, Eric; Chhowalla, Manish.

In: Advanced Functional Materials, Vol. 19, No. 16, 2009, p. 2577-2583.

Research output: Contribution to journalArticle

Mattevi, Cecilia ; Eda, Goki ; Agnoli, Stefano ; Miller, Steve ; Mkhoyan, K. Andre ; Celik, Ozgur ; Mastrogiovanni, Daniel ; Cranozzi, Caetano ; Garfunkel, Eric ; Chhowalla, Manish. / Evolution of electrical, chemical, and structural properties of transparent and conducting chemically derived craphene thin films. In: Advanced Functional Materials. 2009 ; Vol. 19, No. 16. pp. 2577-2583.
@article{a8dbb485da474b60bd1fbfbb658bbadd,
title = "Evolution of electrical, chemical, and structural properties of transparent and conducting chemically derived craphene thin films",
abstract = "A detailed description of the electronic properties, chemical state, and structure of uniform single and few-layered graphene oxide (CO) thin films at different stages of reduction is reported. The residual oxygen content and structure of CO are monitored and these chemical and structural characteristics are correlated to electronic properties of the thin films at various stages of reduction. It is found that the electrical characteristics of reduced GO do not approach those of intrinsic graphene obtained by mechanical cleaving because the material remains significantly oxidized. The residual oxygen forms sp 3 bonds with carbon atoms in the basal plane such that the carbon sp2 bonding fraction in fully reduced CO is ~0.80. The minority sp3 bonds disrupt the transport of carriers delocalized in the sp2 network, limiting the mobility, and conductivity of reduced CO thin films. Extrapolation of electrical conductivity data as a function of oxygen content reveals that complete removal of oxygen should lead to properties that are comparable to graphene.",
author = "Cecilia Mattevi and Goki Eda and Stefano Agnoli and Steve Miller and Mkhoyan, {K. Andre} and Ozgur Celik and Daniel Mastrogiovanni and Caetano Cranozzi and Eric Garfunkel and Manish Chhowalla",
year = "2009",
doi = "10.1002/adfm.200900166",
language = "English",
volume = "19",
pages = "2577--2583",
journal = "Advanced Functional Materials",
issn = "1616-301X",
publisher = "Wiley-VCH Verlag",
number = "16",

}

TY - JOUR

T1 - Evolution of electrical, chemical, and structural properties of transparent and conducting chemically derived craphene thin films

AU - Mattevi, Cecilia

AU - Eda, Goki

AU - Agnoli, Stefano

AU - Miller, Steve

AU - Mkhoyan, K. Andre

AU - Celik, Ozgur

AU - Mastrogiovanni, Daniel

AU - Cranozzi, Caetano

AU - Garfunkel, Eric

AU - Chhowalla, Manish

PY - 2009

Y1 - 2009

N2 - A detailed description of the electronic properties, chemical state, and structure of uniform single and few-layered graphene oxide (CO) thin films at different stages of reduction is reported. The residual oxygen content and structure of CO are monitored and these chemical and structural characteristics are correlated to electronic properties of the thin films at various stages of reduction. It is found that the electrical characteristics of reduced GO do not approach those of intrinsic graphene obtained by mechanical cleaving because the material remains significantly oxidized. The residual oxygen forms sp 3 bonds with carbon atoms in the basal plane such that the carbon sp2 bonding fraction in fully reduced CO is ~0.80. The minority sp3 bonds disrupt the transport of carriers delocalized in the sp2 network, limiting the mobility, and conductivity of reduced CO thin films. Extrapolation of electrical conductivity data as a function of oxygen content reveals that complete removal of oxygen should lead to properties that are comparable to graphene.

AB - A detailed description of the electronic properties, chemical state, and structure of uniform single and few-layered graphene oxide (CO) thin films at different stages of reduction is reported. The residual oxygen content and structure of CO are monitored and these chemical and structural characteristics are correlated to electronic properties of the thin films at various stages of reduction. It is found that the electrical characteristics of reduced GO do not approach those of intrinsic graphene obtained by mechanical cleaving because the material remains significantly oxidized. The residual oxygen forms sp 3 bonds with carbon atoms in the basal plane such that the carbon sp2 bonding fraction in fully reduced CO is ~0.80. The minority sp3 bonds disrupt the transport of carriers delocalized in the sp2 network, limiting the mobility, and conductivity of reduced CO thin films. Extrapolation of electrical conductivity data as a function of oxygen content reveals that complete removal of oxygen should lead to properties that are comparable to graphene.

UR - http://www.scopus.com/inward/record.url?scp=70349231471&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=70349231471&partnerID=8YFLogxK

U2 - 10.1002/adfm.200900166

DO - 10.1002/adfm.200900166

M3 - Article

VL - 19

SP - 2577

EP - 2583

JO - Advanced Functional Materials

JF - Advanced Functional Materials

SN - 1616-301X

IS - 16

ER -