Experimental limitations in impedance spectroscopy of materials systems

G. Hsieh, D. D. Edwards, S. J. Ford, J. H. Hwang, J. Shane, E. J. Garboczi, Thomas O Mason

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Pages3-12
Number of pages10
Volume411
Publication statusPublished - 1996
EventProceedings of the 1995 MRS Fall Meeting - Boston, MA, USA
Duration: Nov 26 1995Dec 1 1995

Other

OtherProceedings of the 1995 MRS Fall Meeting
CityBoston, MA, USA
Period11/26/9512/1/95

Fingerprint

Spectroscopy
Electrodes
Electric grounding
Shielding
Resistors
Capacitors
Pixels
Computer simulation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Hsieh, G., Edwards, D. D., Ford, S. J., Hwang, J. H., Shane, J., Garboczi, E. J., & Mason, T. O. (1996). Experimental limitations in impedance spectroscopy of materials systems. In Materials Research Society Symposium - Proceedings (Vol. 411, pp. 3-12). Materials Research Society.

Experimental limitations in impedance spectroscopy of materials systems. / Hsieh, G.; Edwards, D. D.; Ford, S. J.; Hwang, J. H.; Shane, J.; Garboczi, E. J.; Mason, Thomas O.

Materials Research Society Symposium - Proceedings. Vol. 411 Materials Research Society, 1996. p. 3-12.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hsieh, G, Edwards, DD, Ford, SJ, Hwang, JH, Shane, J, Garboczi, EJ & Mason, TO 1996, Experimental limitations in impedance spectroscopy of materials systems. in Materials Research Society Symposium - Proceedings. vol. 411, Materials Research Society, pp. 3-12, Proceedings of the 1995 MRS Fall Meeting, Boston, MA, USA, 11/26/95.
Hsieh G, Edwards DD, Ford SJ, Hwang JH, Shane J, Garboczi EJ et al. Experimental limitations in impedance spectroscopy of materials systems. In Materials Research Society Symposium - Proceedings. Vol. 411. Materials Research Society. 1996. p. 3-12
Hsieh, G. ; Edwards, D. D. ; Ford, S. J. ; Hwang, J. H. ; Shane, J. ; Garboczi, E. J. ; Mason, Thomas O. / Experimental limitations in impedance spectroscopy of materials systems. Materials Research Society Symposium - Proceedings. Vol. 411 Materials Research Society, 1996. pp. 3-12
@inproceedings{cea4c3691f6145eda5ce623c2f638295,
title = "Experimental limitations in impedance spectroscopy of materials systems",
abstract = "Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.",
author = "G. Hsieh and Edwards, {D. D.} and Ford, {S. J.} and Hwang, {J. H.} and J. Shane and Garboczi, {E. J.} and Mason, {Thomas O}",
year = "1996",
language = "English",
volume = "411",
pages = "3--12",
booktitle = "Materials Research Society Symposium - Proceedings",
publisher = "Materials Research Society",

}

TY - GEN

T1 - Experimental limitations in impedance spectroscopy of materials systems

AU - Hsieh, G.

AU - Edwards, D. D.

AU - Ford, S. J.

AU - Hwang, J. H.

AU - Shane, J.

AU - Garboczi, E. J.

AU - Mason, Thomas O

PY - 1996

Y1 - 1996

N2 - Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.

AB - Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.

UR - http://www.scopus.com/inward/record.url?scp=0029727024&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029727024&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0029727024

VL - 411

SP - 3

EP - 12

BT - Materials Research Society Symposium - Proceedings

PB - Materials Research Society

ER -