Abstract
Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.
| Original language | English |
|---|---|
| Title of host publication | Materials Research Society Symposium - Proceedings |
| Publisher | Materials Research Society |
| Pages | 3-12 |
| Number of pages | 10 |
| Volume | 411 |
| Publication status | Published - 1996 |
| Event | Proceedings of the 1995 MRS Fall Meeting - Boston, MA, USA Duration: Nov 26 1995 → Dec 1 1995 |
Other
| Other | Proceedings of the 1995 MRS Fall Meeting |
|---|---|
| City | Boston, MA, USA |
| Period | 11/26/95 → 12/1/95 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
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Hsieh, G., Edwards, D. D., Ford, S. J., Hwang, J. H., Shane, J., Garboczi, E. J., & Mason, T. O. (1996). Experimental limitations in impedance spectroscopy of materials systems. In Materials Research Society Symposium - Proceedings (Vol. 411, pp. 3-12). Materials Research Society.