Experimental limitations in impedance spectroscopy of materials systems

G. Hsieh; D. D. Edwards; S. J. Ford; J. H. Hwang; J. Shane; E. J. Garboczi; Thomas O Mason

Experimental limitations in impedance spectroscopy of materials systems

G. Hsieh, D. D. Edwards, S. J. Ford, J. H. Hwang, J. Shane, E. J. Garboczi, Thomas O Mason

Northwestern University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.

Original language	English
Title of host publication	Materials Research Society Symposium - Proceedings
Publisher	Materials Research Society
Pages	3-12
Number of pages	10
Volume	411
Publication status	Published - 1996
Event	Proceedings of the 1995 MRS Fall Meeting - Boston, MA, USA Duration: Nov 26 1995 → Dec 1 1995

Other

Other	Proceedings of the 1995 MRS Fall Meeting
City	Boston, MA, USA
Period	11/26/95 → 12/1/95

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Experimental limitations in impedance spectroscopy of materials systems'. Together they form a unique fingerprint.

Cite this

@inproceedings{cea4c3691f6145eda5ce623c2f638295,

title = "Experimental limitations in impedance spectroscopy of materials systems",

abstract = "Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.",

author = "G. Hsieh and Edwards, {D. D.} and Ford, {S. J.} and Hwang, {J. H.} and J. Shane and Garboczi, {E. J.} and Mason, {Thomas O}",

year = "1996",

language = "English",

volume = "411",

pages = "3--12",

booktitle = "Materials Research Society Symposium - Proceedings",

publisher = "Materials Research Society",

note = "Proceedings of the 1995 MRS Fall Meeting ; Conference date: 26-11-1995 Through 01-12-1995",

}

TY - GEN

T1 - Experimental limitations in impedance spectroscopy of materials systems

AU - Hsieh, G.

AU - Edwards, D. D.

AU - Ford, S. J.

AU - Hwang, J. H.

AU - Shane, J.

AU - Garboczi, E. J.

AU - Mason, Thomas O

PY - 1996

Y1 - 1996

N2 - Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.

AB - Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.

UR - http://www.scopus.com/inward/record.url?scp=0029727024&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029727024&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0029727024

VL - 411

SP - 3

EP - 12

BT - Materials Research Society Symposium - Proceedings

PB - Materials Research Society

T2 - Proceedings of the 1995 MRS Fall Meeting

Y2 - 26 November 1995 through 1 December 1995

ER -