Abstract
Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.
| Original language | English |
|---|---|
| Title of host publication | Materials Research Society Symposium - Proceedings |
| Publisher | Materials Research Society |
| Pages | 3-12 |
| Number of pages | 10 |
| Volume | 411 |
| Publication status | Published - 1996 |
| Event | Proceedings of the 1995 MRS Fall Meeting - Boston, MA, USA Duration: Nov 26 1995 → Dec 1 1995 |
Other
| Other | Proceedings of the 1995 MRS Fall Meeting |
|---|---|
| City | Boston, MA, USA |
| Period | 11/26/95 → 12/1/95 |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
Cite this
Experimental limitations in impedance spectroscopy of materials systems. / Hsieh, G.; Edwards, D. D.; Ford, S. J.; Hwang, J. H.; Shane, J.; Garboczi, E. J.; Mason, Thomas O.
Materials Research Society Symposium - Proceedings. Vol. 411 Materials Research Society, 1996. p. 3-12.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Experimental limitations in impedance spectroscopy of materials systems
AU - Hsieh, G.
AU - Edwards, D. D.
AU - Ford, S. J.
AU - Hwang, J. H.
AU - Shane, J.
AU - Garboczi, E. J.
AU - Mason, Thomas O
PY - 1996
Y1 - 1996
N2 - Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.
AB - Using resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.
UR - http://www.scopus.com/inward/record.url?scp=0029727024&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0029727024&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0029727024
VL - 411
SP - 3
EP - 12
BT - Materials Research Society Symposium - Proceedings
PB - Materials Research Society
ER -