Experimental limitations in impedance spectroscopy

Part V. Apparatus contributions and corrections

D. D. Edwards, J. H. Hwang, S. J. Ford, Thomas O Mason

Research output: Contribution to journalArticle

50 Citations (Scopus)

Abstract

Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.

Original languageEnglish
Pages (from-to)85-93
Number of pages9
JournalSolid State Ionics
Volume99
Issue number1-2
Publication statusPublished - Aug 1 1997

Fingerprint

Remediation
Shielding
Spectroscopy
impedance
impedance measurement
holders
spectroscopy
shielding
artifacts
adjusting

Keywords

  • Apparatus
  • Impedance spectroscopy
  • Simulation

ASJC Scopus subject areas

  • Electrochemistry
  • Physical and Theoretical Chemistry
  • Energy Engineering and Power Technology
  • Materials Chemistry
  • Condensed Matter Physics

Cite this

Experimental limitations in impedance spectroscopy : Part V. Apparatus contributions and corrections. / Edwards, D. D.; Hwang, J. H.; Ford, S. J.; Mason, Thomas O.

In: Solid State Ionics, Vol. 99, No. 1-2, 01.08.1997, p. 85-93.

Research output: Contribution to journalArticle

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