Abstract
Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.
| Original language | English |
|---|---|
| Pages (from-to) | 85-93 |
| Number of pages | 9 |
| Journal | Solid State Ionics |
| Volume | 99 |
| Issue number | 1-2 |
| Publication status | Published - Aug 1 1997 |
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Keywords
- Apparatus
- Impedance spectroscopy
- Simulation
ASJC Scopus subject areas
- Electrochemistry
- Physical and Theoretical Chemistry
- Energy Engineering and Power Technology
- Materials Chemistry
- Condensed Matter Physics
Cite this
Experimental limitations in impedance spectroscopy : Part V. Apparatus contributions and corrections. / Edwards, D. D.; Hwang, J. H.; Ford, S. J.; Mason, Thomas O.
In: Solid State Ionics, Vol. 99, No. 1-2, 01.08.1997, p. 85-93.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Experimental limitations in impedance spectroscopy
T2 - Part V. Apparatus contributions and corrections
AU - Edwards, D. D.
AU - Hwang, J. H.
AU - Ford, S. J.
AU - Mason, Thomas O
PY - 1997/8/1
Y1 - 1997/8/1
N2 - Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.
AB - Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.
KW - Apparatus
KW - Impedance spectroscopy
KW - Simulation
UR - http://www.scopus.com/inward/record.url?scp=0031209232&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0031209232&partnerID=8YFLogxK
M3 - Article
VL - 99
SP - 85
EP - 93
JO - Solid State Ionics
JF - Solid State Ionics
SN - 0167-2738
IS - 1-2
ER -