Abstract
Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.
| Original language | English |
|---|---|
| Pages (from-to) | 85-93 |
| Number of pages | 9 |
| Journal | Solid State Ionics |
| Volume | 99 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - Aug 1 1997 |
Keywords
- Apparatus
- Impedance spectroscopy
- Simulation
ASJC Scopus subject areas
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics
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Edwards, D. D., Hwang, J. H., Ford, S. J., & Mason, T. O. (1997). Experimental limitations in impedance spectroscopy: Part V. Apparatus contributions and corrections. Solid State Ionics, 99(1-2), 85-93. https://doi.org/10.1016/s0167-2738(97)00206-3