Experimental limitations in impedance spectroscopy: Part V. Apparatus contributions and corrections

D. D. Edwards; J. H. Hwang; S. J. Ford; T. O. Mason

doi:10.1016/s0167-2738(97)00206-3

Experimental limitations in impedance spectroscopy: Part V. Apparatus contributions and corrections

D. D. Edwards, J. H. Hwang, S. J. Ford, T. O. Mason

Northwestern University

Research output: Contribution to journal › Article › peer-review

54 Citations (Scopus)

Abstract

Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.

Original language	English
Pages (from-to)	85-93
Number of pages	9
Journal	Solid State Ionics
Volume	99
Issue number	1-2
DOIs	https://doi.org/10.1016/s0167-2738(97)00206-3
Publication status	Published - Aug 1 1997

Keywords

Apparatus
Impedance spectroscopy
Simulation

ASJC Scopus subject areas

Chemistry(all)
Materials Science(all)
Condensed Matter Physics

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10.1016/s0167-2738(97)00206-3

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title = "Experimental limitations in impedance spectroscopy: Part V. Apparatus contributions and corrections",

abstract = "Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.",

keywords = "Apparatus, Impedance spectroscopy, Simulation",

author = "Edwards, {D. D.} and Hwang, {J. H.} and Ford, {S. J.} and Mason, {T. O.}",

note = "Funding Information: This work was supported by the U.S. Department of Energy under grant no. FG02-84-ER45097 (JHH, TOM) and the National Science Foundation under Materials Research Science and Engineering Centres grant no. DMR-91-20521 (DE, TOM) and under Science and Technology Centres grant no. DMR-91-20002 (SJF, TOM). The authors are grateful to Dr. William Hammetter of Sandia National Labs for helpful discussions.",

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doi = "10.1016/s0167-2738(97)00206-3",

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T2 - Part V. Apparatus contributions and corrections

AU - Edwards, D. D.

AU - Hwang, J. H.

AU - Ford, S. J.

AU - Mason, T. O.

N1 - Funding Information: This work was supported by the U.S. Department of Energy under grant no. FG02-84-ER45097 (JHH, TOM) and the National Science Foundation under Materials Research Science and Engineering Centres grant no. DMR-91-20521 (DE, TOM) and under Science and Technology Centres grant no. DMR-91-20002 (SJF, TOM). The authors are grateful to Dr. William Hammetter of Sandia National Labs for helpful discussions.

PY - 1997/8/1

Y1 - 1997/8/1

N2 - Overlooked apparatus (cabling, leads, sample holder) contributions to experimental impedance spectra can be significant, especially at high frequencies, and can obscure the true sample response. Instrumental limitations are discussed and high-frequency artifacts arising from apparatus contributions are investigated as they pertain to accurate impedance measurements of materials systems. Remediation strategies are presented, including geometrical adjustments, lead shielding, and null-correction procedures.

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KW - Apparatus

KW - Impedance spectroscopy

KW - Simulation

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Experimental limitations in impedance spectroscopy: Part V. Apparatus contributions and corrections

Abstract

Keywords

ASJC Scopus subject areas

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