Fabrication and characterization of Er-doped ZnO films grown by pulsed E-beam deposition

Z. Pan, S. H. Morgan, A. Ueda, R. Aga, A. Steigerwald, R. Mu, A. B. Hmelo, L. Feldman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Erbium-doped ZnO thin films with nano-size grains were grown on silicon substrate by pulsed e-beam deposition. The luminescence provides evidence that the Er ions have been incorporated inside the crystalline ZnO grains in film.

Original languageEnglish
Title of host publicationFrontiers in Optics, FiO 2007
PublisherOptical Society of America
ISBN (Print)1557528462, 9781557528469
Publication statusPublished - Jan 1 2007
EventFrontiers in Optics, FiO 2007 - San Jose, CA, United States
Duration: Sep 16 2007Sep 16 2007

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherFrontiers in Optics, FiO 2007
CountryUnited States
CitySan Jose, CA
Period9/16/079/16/07

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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    Pan, Z., Morgan, S. H., Ueda, A., Aga, R., Steigerwald, A., Mu, R., Hmelo, A. B., & Feldman, L. (2007). Fabrication and characterization of Er-doped ZnO films grown by pulsed E-beam deposition. In Frontiers in Optics, FiO 2007 (Optics InfoBase Conference Papers). Optical Society of America.