Abstract
Erbium-doped ZnO thin films with nano-size grains were grown on silicon substrate by pulsed e-beam deposition. The luminescence provides evidence that the Er ions have been incorporated inside the crystalline ZnO grains in film.
| Original language | English |
|---|---|
| Title of host publication | Frontiers in Optics, FiO 2007 |
| Publisher | Optical Society of America |
| ISBN (Print) | 1557528462, 9781557528469 |
| Publication status | Published - Jan 1 2007 |
| Event | Frontiers in Optics, FiO 2007 - San Jose, CA, United States Duration: Sep 16 2007 → Sep 16 2007 |
Publication series
| Name | Optics InfoBase Conference Papers |
|---|---|
| ISSN (Electronic) | 2162-2701 |
Other
| Other | Frontiers in Optics, FiO 2007 |
|---|---|
| Country | United States |
| City | San Jose, CA |
| Period | 9/16/07 → 9/16/07 |
ASJC Scopus subject areas
- Instrumentation
- Atomic and Molecular Physics, and Optics
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Cite this
Pan, Z., Morgan, S. H., Ueda, A., Aga, R., Steigerwald, A., Mu, R., Hmelo, A. B., & Feldman, L. (2007). Fabrication and characterization of Er-doped ZnO films grown by pulsed E-beam deposition. In Frontiers in Optics, FiO 2007 (Optics InfoBase Conference Papers). Optical Society of America.