Femtosecond protein nanocrystallography- Data analysis methods

Richard A. Kirian, Xiaoyu Wang, Uwe Weierstall, Kevin E. Schmidt, John C H Spence, Mark Hunter, Petra Fromme, Thomas White, Henry N. Chapman, James Holton

Research output: Contribution to journalArticle

152 Citations (Scopus)

Abstract

X-ray diffraction patterns may be obtained from individual submicron protein nanocrystals using a femtosecond pulse from a free-electron X-ray laser. Many single-shot patterns are read out every second from a stream of nanocrystals lying in random orientations. The short pulse terminates before significant atomic (or electronic) motion commences, minimizing radiation damage. Simulated patterns for Photosystem I nanocrystals are used to develop a method for recovering structure factors from tens of thousands of snapshot patterns from nanocrystals varying in size, shape and orientation. We determine the number of shots needed for a required accuracy in structure factor measurement and resolution, and investigate the convergence of our Monte-Carlo integration method.

Original languageEnglish
Pages (from-to)5713-5723
Number of pages11
JournalOptics Express
Volume18
Issue number6
DOIs
Publication statusPublished - Mar 15 2010

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nanocrystals
proteins
shot
pulses
radiation damage
free electrons
x rays
diffraction patterns
electronics
lasers

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Kirian, R. A., Wang, X., Weierstall, U., Schmidt, K. E., Spence, J. C. H., Hunter, M., ... Holton, J. (2010). Femtosecond protein nanocrystallography- Data analysis methods. Optics Express, 18(6), 5713-5723. https://doi.org/10.1364/OE.18.005713

Femtosecond protein nanocrystallography- Data analysis methods. / Kirian, Richard A.; Wang, Xiaoyu; Weierstall, Uwe; Schmidt, Kevin E.; Spence, John C H; Hunter, Mark; Fromme, Petra; White, Thomas; Chapman, Henry N.; Holton, James.

In: Optics Express, Vol. 18, No. 6, 15.03.2010, p. 5713-5723.

Research output: Contribution to journalArticle

Kirian, RA, Wang, X, Weierstall, U, Schmidt, KE, Spence, JCH, Hunter, M, Fromme, P, White, T, Chapman, HN & Holton, J 2010, 'Femtosecond protein nanocrystallography- Data analysis methods', Optics Express, vol. 18, no. 6, pp. 5713-5723. https://doi.org/10.1364/OE.18.005713
Kirian RA, Wang X, Weierstall U, Schmidt KE, Spence JCH, Hunter M et al. Femtosecond protein nanocrystallography- Data analysis methods. Optics Express. 2010 Mar 15;18(6):5713-5723. https://doi.org/10.1364/OE.18.005713
Kirian, Richard A. ; Wang, Xiaoyu ; Weierstall, Uwe ; Schmidt, Kevin E. ; Spence, John C H ; Hunter, Mark ; Fromme, Petra ; White, Thomas ; Chapman, Henry N. ; Holton, James. / Femtosecond protein nanocrystallography- Data analysis methods. In: Optics Express. 2010 ; Vol. 18, No. 6. pp. 5713-5723.
@article{50c23b26e2ac407fb6fe7ada037391b4,
title = "Femtosecond protein nanocrystallography- Data analysis methods",
abstract = "X-ray diffraction patterns may be obtained from individual submicron protein nanocrystals using a femtosecond pulse from a free-electron X-ray laser. Many single-shot patterns are read out every second from a stream of nanocrystals lying in random orientations. The short pulse terminates before significant atomic (or electronic) motion commences, minimizing radiation damage. Simulated patterns for Photosystem I nanocrystals are used to develop a method for recovering structure factors from tens of thousands of snapshot patterns from nanocrystals varying in size, shape and orientation. We determine the number of shots needed for a required accuracy in structure factor measurement and resolution, and investigate the convergence of our Monte-Carlo integration method.",
author = "Kirian, {Richard A.} and Xiaoyu Wang and Uwe Weierstall and Schmidt, {Kevin E.} and Spence, {John C H} and Mark Hunter and Petra Fromme and Thomas White and Chapman, {Henry N.} and James Holton",
year = "2010",
month = "3",
day = "15",
doi = "10.1364/OE.18.005713",
language = "English",
volume = "18",
pages = "5713--5723",
journal = "Optics Express",
issn = "1094-4087",
publisher = "The Optical Society",
number = "6",

}

TY - JOUR

T1 - Femtosecond protein nanocrystallography- Data analysis methods

AU - Kirian, Richard A.

AU - Wang, Xiaoyu

AU - Weierstall, Uwe

AU - Schmidt, Kevin E.

AU - Spence, John C H

AU - Hunter, Mark

AU - Fromme, Petra

AU - White, Thomas

AU - Chapman, Henry N.

AU - Holton, James

PY - 2010/3/15

Y1 - 2010/3/15

N2 - X-ray diffraction patterns may be obtained from individual submicron protein nanocrystals using a femtosecond pulse from a free-electron X-ray laser. Many single-shot patterns are read out every second from a stream of nanocrystals lying in random orientations. The short pulse terminates before significant atomic (or electronic) motion commences, minimizing radiation damage. Simulated patterns for Photosystem I nanocrystals are used to develop a method for recovering structure factors from tens of thousands of snapshot patterns from nanocrystals varying in size, shape and orientation. We determine the number of shots needed for a required accuracy in structure factor measurement and resolution, and investigate the convergence of our Monte-Carlo integration method.

AB - X-ray diffraction patterns may be obtained from individual submicron protein nanocrystals using a femtosecond pulse from a free-electron X-ray laser. Many single-shot patterns are read out every second from a stream of nanocrystals lying in random orientations. The short pulse terminates before significant atomic (or electronic) motion commences, minimizing radiation damage. Simulated patterns for Photosystem I nanocrystals are used to develop a method for recovering structure factors from tens of thousands of snapshot patterns from nanocrystals varying in size, shape and orientation. We determine the number of shots needed for a required accuracy in structure factor measurement and resolution, and investigate the convergence of our Monte-Carlo integration method.

UR - http://www.scopus.com/inward/record.url?scp=77949588458&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77949588458&partnerID=8YFLogxK

U2 - 10.1364/OE.18.005713

DO - 10.1364/OE.18.005713

M3 - Article

VL - 18

SP - 5713

EP - 5723

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 6

ER -