Field emission from atomically thin edges of reduced graphene oxide

Hisato Yamaguchi, Katsuhisa Murakami, Goki Eda, Takeshi Fujita, Pengfei Guan, Weichao Wang, Cheng Gong, Julien Boisse, Steve Miller, Muge Acik, Kyeongjae Cho, Yves J. Chabal, Mingwei Chen, Fujio Wakaya, Mikio Takai, Manish Chhowalla

Research output: Contribution to journalArticle

111 Citations (Scopus)

Abstract

Point sources exhibit low threshold electron emission due to local field enhancement at the tip. The development and implementation of tip emitters have been hampered by the need to position them sufficiently apart to achieve field enhancement, limiting the number of emission sites and therefore the overall current. Here we report low threshold field (<0.1 V/μm) emission of multiple electron beams from atomically thin edges of reduced graphene oxide (rGO). Field emission microscopy measurements show evidence for interference from emission sites that are separated by a few nanometers, suggesting that the emitted electron beams are coherent. On the basis of our high-resolution transmission electron microscopy, infrared spectroscopy, and simulation results, field emission from the rGO edge is attributed to a stable and unique aggregation of oxygen groups in the form of cyclic edge ethers. Such closely spaced electron beams from rGO offer prospects for novel applications and understanding the physics of linear electron sources.

Original languageEnglish
Pages (from-to)4945-4952
Number of pages8
JournalACS Nano
Volume5
Issue number6
DOIs
Publication statusPublished - Jun 28 2011

Fingerprint

Graphite
Field emission
Oxides
Graphene
field emission
Electron beams
graphene
electron beams
oxides
Cyclic Ethers
Electron sources
thresholds
electron sources
augmentation
Electron emission
High resolution transmission electron microscopy
electron emission
point sources
Infrared spectroscopy
Ethers

Keywords

  • atomically thin edge
  • chemically derived grapheme
  • field electron emission
  • field emission pattern
  • interference
  • low threshold field
  • reduced graphene oxide

ASJC Scopus subject areas

  • Engineering(all)
  • Materials Science(all)
  • Physics and Astronomy(all)

Cite this

Yamaguchi, H., Murakami, K., Eda, G., Fujita, T., Guan, P., Wang, W., ... Chhowalla, M. (2011). Field emission from atomically thin edges of reduced graphene oxide. ACS Nano, 5(6), 4945-4952. https://doi.org/10.1021/nn201043a

Field emission from atomically thin edges of reduced graphene oxide. / Yamaguchi, Hisato; Murakami, Katsuhisa; Eda, Goki; Fujita, Takeshi; Guan, Pengfei; Wang, Weichao; Gong, Cheng; Boisse, Julien; Miller, Steve; Acik, Muge; Cho, Kyeongjae; Chabal, Yves J.; Chen, Mingwei; Wakaya, Fujio; Takai, Mikio; Chhowalla, Manish.

In: ACS Nano, Vol. 5, No. 6, 28.06.2011, p. 4945-4952.

Research output: Contribution to journalArticle

Yamaguchi, H, Murakami, K, Eda, G, Fujita, T, Guan, P, Wang, W, Gong, C, Boisse, J, Miller, S, Acik, M, Cho, K, Chabal, YJ, Chen, M, Wakaya, F, Takai, M & Chhowalla, M 2011, 'Field emission from atomically thin edges of reduced graphene oxide', ACS Nano, vol. 5, no. 6, pp. 4945-4952. https://doi.org/10.1021/nn201043a
Yamaguchi H, Murakami K, Eda G, Fujita T, Guan P, Wang W et al. Field emission from atomically thin edges of reduced graphene oxide. ACS Nano. 2011 Jun 28;5(6):4945-4952. https://doi.org/10.1021/nn201043a
Yamaguchi, Hisato ; Murakami, Katsuhisa ; Eda, Goki ; Fujita, Takeshi ; Guan, Pengfei ; Wang, Weichao ; Gong, Cheng ; Boisse, Julien ; Miller, Steve ; Acik, Muge ; Cho, Kyeongjae ; Chabal, Yves J. ; Chen, Mingwei ; Wakaya, Fujio ; Takai, Mikio ; Chhowalla, Manish. / Field emission from atomically thin edges of reduced graphene oxide. In: ACS Nano. 2011 ; Vol. 5, No. 6. pp. 4945-4952.
@article{2332e42de1204bc499b46d8e5b947ad4,
title = "Field emission from atomically thin edges of reduced graphene oxide",
abstract = "Point sources exhibit low threshold electron emission due to local field enhancement at the tip. The development and implementation of tip emitters have been hampered by the need to position them sufficiently apart to achieve field enhancement, limiting the number of emission sites and therefore the overall current. Here we report low threshold field (<0.1 V/μm) emission of multiple electron beams from atomically thin edges of reduced graphene oxide (rGO). Field emission microscopy measurements show evidence for interference from emission sites that are separated by a few nanometers, suggesting that the emitted electron beams are coherent. On the basis of our high-resolution transmission electron microscopy, infrared spectroscopy, and simulation results, field emission from the rGO edge is attributed to a stable and unique aggregation of oxygen groups in the form of cyclic edge ethers. Such closely spaced electron beams from rGO offer prospects for novel applications and understanding the physics of linear electron sources.",
keywords = "atomically thin edge, chemically derived grapheme, field electron emission, field emission pattern, interference, low threshold field, reduced graphene oxide",
author = "Hisato Yamaguchi and Katsuhisa Murakami and Goki Eda and Takeshi Fujita and Pengfei Guan and Weichao Wang and Cheng Gong and Julien Boisse and Steve Miller and Muge Acik and Kyeongjae Cho and Chabal, {Yves J.} and Mingwei Chen and Fujio Wakaya and Mikio Takai and Manish Chhowalla",
year = "2011",
month = "6",
day = "28",
doi = "10.1021/nn201043a",
language = "English",
volume = "5",
pages = "4945--4952",
journal = "ACS Nano",
issn = "1936-0851",
publisher = "American Chemical Society",
number = "6",

}

TY - JOUR

T1 - Field emission from atomically thin edges of reduced graphene oxide

AU - Yamaguchi, Hisato

AU - Murakami, Katsuhisa

AU - Eda, Goki

AU - Fujita, Takeshi

AU - Guan, Pengfei

AU - Wang, Weichao

AU - Gong, Cheng

AU - Boisse, Julien

AU - Miller, Steve

AU - Acik, Muge

AU - Cho, Kyeongjae

AU - Chabal, Yves J.

AU - Chen, Mingwei

AU - Wakaya, Fujio

AU - Takai, Mikio

AU - Chhowalla, Manish

PY - 2011/6/28

Y1 - 2011/6/28

N2 - Point sources exhibit low threshold electron emission due to local field enhancement at the tip. The development and implementation of tip emitters have been hampered by the need to position them sufficiently apart to achieve field enhancement, limiting the number of emission sites and therefore the overall current. Here we report low threshold field (<0.1 V/μm) emission of multiple electron beams from atomically thin edges of reduced graphene oxide (rGO). Field emission microscopy measurements show evidence for interference from emission sites that are separated by a few nanometers, suggesting that the emitted electron beams are coherent. On the basis of our high-resolution transmission electron microscopy, infrared spectroscopy, and simulation results, field emission from the rGO edge is attributed to a stable and unique aggregation of oxygen groups in the form of cyclic edge ethers. Such closely spaced electron beams from rGO offer prospects for novel applications and understanding the physics of linear electron sources.

AB - Point sources exhibit low threshold electron emission due to local field enhancement at the tip. The development and implementation of tip emitters have been hampered by the need to position them sufficiently apart to achieve field enhancement, limiting the number of emission sites and therefore the overall current. Here we report low threshold field (<0.1 V/μm) emission of multiple electron beams from atomically thin edges of reduced graphene oxide (rGO). Field emission microscopy measurements show evidence for interference from emission sites that are separated by a few nanometers, suggesting that the emitted electron beams are coherent. On the basis of our high-resolution transmission electron microscopy, infrared spectroscopy, and simulation results, field emission from the rGO edge is attributed to a stable and unique aggregation of oxygen groups in the form of cyclic edge ethers. Such closely spaced electron beams from rGO offer prospects for novel applications and understanding the physics of linear electron sources.

KW - atomically thin edge

KW - chemically derived grapheme

KW - field electron emission

KW - field emission pattern

KW - interference

KW - low threshold field

KW - reduced graphene oxide

UR - http://www.scopus.com/inward/record.url?scp=79959781014&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79959781014&partnerID=8YFLogxK

U2 - 10.1021/nn201043a

DO - 10.1021/nn201043a

M3 - Article

C2 - 21618992

AN - SCOPUS:79959781014

VL - 5

SP - 4945

EP - 4952

JO - ACS Nano

JF - ACS Nano

SN - 1936-0851

IS - 6

ER -