Abstract
Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude more information than traditional solution scattering data. Such experiments can be performed using the ultrashort X-ray pulses provided by a free-electron laser source, allowing one to collect a large number of diffraction patterns in a relatively short time. Here, we describe a test data set for FXS, obtained at the Linac Coherent Light Source, consisting of close to 100 000 multi-particle diffraction patterns originating from approximately 50 to 200 Paramecium Bursaria Chlorella virus particles per snapshot. In addition to the raw data, a selection of high-quality pre-processed diffraction patterns and a reference SAXS profile are provided.
| Original language | English |
|---|---|
| Article number | 180201 |
| Journal | Scientific data |
| Volume | 5 |
| DOIs | |
| Publication status | Published - Jan 1 2018 |
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ASJC Scopus subject areas
- Statistics and Probability
- Information Systems
- Education
- Computer Science Applications
- Statistics, Probability and Uncertainty
- Library and Information Sciences
Cite this
Free-electron laser data for multiple-particle fluctuation scattering analysis. / Pande, Kanupriya; Donatelli, Jeffrey J.; Malmerberg, Erik; Foucar, Lutz; Poon, Billy K.; Sutter, Markus; Botha, Sabine; Basu, Shibom; Doak, R. Bruce; Dörner, Katerina; Epp, Sascha W.; Englert, Lars; Fromme, Raimund; Hartmann, Elisabeth; Hartmann, Robert; Hauser, Guenter; Hattne, Johan; Hosseinizadeh, Ahmad; Kassemeyer, Stephan; Lomb, Lukas; Carron Montero, Sebastian F.; Menzel, Andreas; Rolles, Daniel; Rudenko, Artem; Seibert, Marvin M.; Sierra, Raymond George; Schwander, Peter; Ourmazd, Abbas; Fromme, Petra; Sauter, Nicholas K.; Bogan, Michael; Bozek, John; Bostedt, Christoph; Schlichting, Ilme; Kerfeld, Cheryl A.; Zwart, Petrus H.
In: Scientific data, Vol. 5, 180201, 01.01.2018.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Free-electron laser data for multiple-particle fluctuation scattering analysis
AU - Pande, Kanupriya
AU - Donatelli, Jeffrey J.
AU - Malmerberg, Erik
AU - Foucar, Lutz
AU - Poon, Billy K.
AU - Sutter, Markus
AU - Botha, Sabine
AU - Basu, Shibom
AU - Doak, R. Bruce
AU - Dörner, Katerina
AU - Epp, Sascha W.
AU - Englert, Lars
AU - Fromme, Raimund
AU - Hartmann, Elisabeth
AU - Hartmann, Robert
AU - Hauser, Guenter
AU - Hattne, Johan
AU - Hosseinizadeh, Ahmad
AU - Kassemeyer, Stephan
AU - Lomb, Lukas
AU - Carron Montero, Sebastian F.
AU - Menzel, Andreas
AU - Rolles, Daniel
AU - Rudenko, Artem
AU - Seibert, Marvin M.
AU - Sierra, Raymond George
AU - Schwander, Peter
AU - Ourmazd, Abbas
AU - Fromme, Petra
AU - Sauter, Nicholas K.
AU - Bogan, Michael
AU - Bozek, John
AU - Bostedt, Christoph
AU - Schlichting, Ilme
AU - Kerfeld, Cheryl A.
AU - Zwart, Petrus H.
PY - 2018/1/1
Y1 - 2018/1/1
N2 - Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude more information than traditional solution scattering data. Such experiments can be performed using the ultrashort X-ray pulses provided by a free-electron laser source, allowing one to collect a large number of diffraction patterns in a relatively short time. Here, we describe a test data set for FXS, obtained at the Linac Coherent Light Source, consisting of close to 100 000 multi-particle diffraction patterns originating from approximately 50 to 200 Paramecium Bursaria Chlorella virus particles per snapshot. In addition to the raw data, a selection of high-quality pre-processed diffraction patterns and a reference SAXS profile are provided.
AB - Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude more information than traditional solution scattering data. Such experiments can be performed using the ultrashort X-ray pulses provided by a free-electron laser source, allowing one to collect a large number of diffraction patterns in a relatively short time. Here, we describe a test data set for FXS, obtained at the Linac Coherent Light Source, consisting of close to 100 000 multi-particle diffraction patterns originating from approximately 50 to 200 Paramecium Bursaria Chlorella virus particles per snapshot. In addition to the raw data, a selection of high-quality pre-processed diffraction patterns and a reference SAXS profile are provided.
UR - http://www.scopus.com/inward/record.url?scp=85054080078&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85054080078&partnerID=8YFLogxK
U2 - 10.1038/sdata.2018.201
DO - 10.1038/sdata.2018.201
M3 - Article
C2 - 30277481
AN - SCOPUS:85054080078
VL - 5
JO - Scientific data
JF - Scientific data
SN - 2052-4463
M1 - 180201
ER -