FTIR. Fundamentals and applications in the analysis of dilute vehicle exhaust

C. A. Gierczak, Jean M. Andino, J. W. Butler, G. A. Heiser, G. Jesion, T. J. Korniski

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Citations (Scopus)

Abstract

FTIR spectroscopy has been shown to be a valuable tool in the analysis of complex gas phase mixtures, such as dilute vehicle exhaust. Regulated and non-regulated vehicle emissions have been routinely sampled and analyzed using prototype instrumentation developed in this laboratory, and in several other laboratories over the last decade. More recently, commercial versions of these FTIR analyzers have become available through several manufacturers. This paper reviews the data acquisition and processing techniques utilized by the FTIR analyzer developed in this laboratory. The statistical detection limits for 22 of the components analyzed by the system are presented. In addition, the linearity of the carbon monoxide (CO) analysis is demonstrated over several orders of magnitude. Experiments designed to study the effects of environmental parameters on the accuracy and the sensitivity to the system are also described.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsHarold I. Schiff
PublisherPubl by Int Soc for Optical Engineering
Pages315-328
Number of pages14
Volume1433
Publication statusPublished - 1991
EventMeasurement of Atmospheric Gases - Los Angeles, CA, USA
Duration: Jan 21 1991Jan 23 1991

Other

OtherMeasurement of Atmospheric Gases
CityLos Angeles, CA, USA
Period1/21/911/23/91

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Gierczak, C. A., Andino, J. M., Butler, J. W., Heiser, G. A., Jesion, G., & Korniski, T. J. (1991). FTIR. Fundamentals and applications in the analysis of dilute vehicle exhaust. In H. I. Schiff (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1433, pp. 315-328). Publ by Int Soc for Optical Engineering.