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Fundamentals of nanoscale film analysis
Terry L. Alford,
Leonard C. Feldman
, James W. Mayer
Rutgers University
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Book/Report
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Book
58
Citations (Scopus)
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Engineering & Materials Science
Photons
Characterization (materials science)
Rutherford backscattering spectroscopy
Nuclear reactions
Particle beams
Scanning probe microscopy
Chemical analysis
Materials science
Diffraction
Field effect transistors
Thin films
Ions
Integrated circuits
Chemical Compounds
Photons
Characterization (materials science)
Rutherford backscattering spectroscopy
Nuclear reactions
Particle beams
Scanning probe microscopy
Chemical analysis
Materials science
Diffraction
Field effect transistors
Thin films
Integrated circuits
Ions