Fused thiophene semiconductors: Crystal structure-film microstructure transistor performance correlations

Jangdae Youn, Sumit Kewalramani, Jonathan D. Emery, Yanrong Shi, Shiming Zhang, Hsiu Chieh Chang, You Jhih Liang, Chia Ming Yeh, Chieh Yuan Feng, Hui Huang, Charlotte Stern, Liang Hsiang Chen, Jia Chong Ho, Ming Chou Chen, Michael J. Bedzyk, Antonio Facchetti, Tobin J. Marks

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

The molecular packing motifs within crystalline domains should be a key determinant of charge transport in thin-film transistors (TFTs) based on small organic molecules. Despite this implied importance, detailed information about molecular organization in polycrystalline thin films is not available for the vast majority of molecular organic semiconductors. Considering the potential of fused thiophenes as environmentally stable, high-performance semiconductors, it is therefore of interest to investigate their thin film microstructures in relation to the single crystal molecular packing and OTFT performance. Here, the molecular packing motifs of several new benzo[d,d′]thieno[3,2-b;4,5- b′]dithiophene (BTDT) derivatives are studied both in bulk 3D crystals and as thin films by single crystal diffraction and grazing incidence wide angle X-ray scattering (GIWAXS), respectively. The results show that the BTDT derivative thin films can have significantly different molecular packing from their bulk crystals. For phenylbenzo[d,d′]thieno[3,2-b;4,5-b′] dithiophene (P-BTDT), 2-biphenylbenzo[d,d′]thieno-[3,2-b;4,5-b′] dithiophene (Bp-BTDT), 2-naphthalenylbenzo[d,d′]thieno[3,2-b;4,5-b′] dithiophene (Np-BTDT), and bisbenzo[d,d′]thieno[3,2-b;4,5-b′] dithiophene (BBTDT), two lattices co-exist, and are significantly strained versus their single crystal forms. For P-BTDT, the dominance of the more strained lattice relative to the bulk-like lattice likely explains the high carrier mobility. In contrast, poor crystallinity and surface coverage at the dielectric/substrate interface explains the marginal OTFT performance of seemingly similar PF-BTDT films.

Original languageEnglish
Pages (from-to)3850-3865
Number of pages16
JournalAdvanced Functional Materials
Volume23
Issue number31
DOIs
Publication statusPublished - Aug 19 2013

Keywords

  • benzothienodithiophene (BTDT)
  • crystal structure
  • grazing-incidence wide-angle X-ray scattering (GIWAXS)
  • organic thin-film transistors (OTFT)

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Fused thiophene semiconductors: Crystal structure-film microstructure transistor performance correlations'. Together they form a unique fingerprint.

  • Cite this

    Youn, J., Kewalramani, S., Emery, J. D., Shi, Y., Zhang, S., Chang, H. C., Liang, Y. J., Yeh, C. M., Feng, C. Y., Huang, H., Stern, C., Chen, L. H., Ho, J. C., Chen, M. C., Bedzyk, M. J., Facchetti, A., & Marks, T. J. (2013). Fused thiophene semiconductors: Crystal structure-film microstructure transistor performance correlations. Advanced Functional Materials, 23(31), 3850-3865. https://doi.org/10.1002/adfm.201203439