Abstract
We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.
| Original language | English |
|---|---|
| Article number | 012116 |
| Journal | Journal of Physics: Conference Series |
| Volume | 712 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Jan 1 2016 |
| Event | 16th International Conference on X-Ray Absorption Fine Structure, XAFS 2015 - Karlsruhe, Germany Duration: Aug 23 2015 → Aug 28 2015 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Moffitt, S. L., Ma, Q., Buchholz, D. B., Chang, R. P. H., Bedzyk, M. J., & Mason, T. O. (2016). Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film. Journal of Physics: Conference Series, 712(1), [012116]. https://doi.org/10.1088/1742-6596/712/1/012116