TY - JOUR
T1 - Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film
AU - Moffitt, S. L.
AU - Ma, Q.
AU - Buchholz, D. B.
AU - Chang, R. P.H.
AU - Bedzyk, M. J.
AU - Mason, T. O.
N1 - Copyright:
Copyright 2018 Elsevier B.V., All rights reserved.
PY - 2016
Y1 - 2016
N2 - We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.
AB - We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.
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U2 - 10.1088/1742-6596/712/1/012116
DO - 10.1088/1742-6596/712/1/012116
M3 - Conference article
AN - SCOPUS:84978718132
VL - 712
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 1
M1 - 012116
T2 - 16th International Conference on X-Ray Absorption Fine Structure, XAFS 2015
Y2 - 23 August 2015 through 28 August 2015
ER -