Abstract
We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N <4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.
| Original language | English |
|---|---|
| Article number | 012116 |
| Journal | Journal of Physics: Conference Series |
| Volume | 712 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2016 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
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Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film. / Moffitt, S. L.; Ma, Q.; Buchholz, D. B.; Chang, Robert P. H.; Bedzyk, M. J.; Mason, Thomas O.
In: Journal of Physics: Conference Series, Vol. 712, No. 1, 012116, 2016.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film
AU - Moffitt, S. L.
AU - Ma, Q.
AU - Buchholz, D. B.
AU - Chang, Robert P. H.
AU - Bedzyk, M. J.
AU - Mason, Thomas O
PY - 2016
Y1 - 2016
N2 - We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N <4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.
AB - We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N <4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.
UR - http://www.scopus.com/inward/record.url?scp=84978718132&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84978718132&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/712/1/012116
DO - 10.1088/1742-6596/712/1/012116
M3 - Article
AN - SCOPUS:84978718132
VL - 712
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 1
M1 - 012116
ER -