Abstract
We have investigated the normal-state resistance and the excess low-frequency (1/f) noise in 45°tilt [001] grain-boundary junctions in YBa2Cu3O7 thin films. A characteristic temperature dependence of the resistance fluctuations and a linear temperature dependence of the grain-boundary resistance (with a negative temperature coefficient) emerge as common features. These observations are quantitatively compared with a model of many, parallel conduction paths across the boundary, taking into account both temperature-independent and thermally activated transport processes.
| Original language | English |
|---|---|
| Pages (from-to) | 16164-16167 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 51 |
| Issue number | 22 |
| DOIs | |
| Publication status | Published - 1995 |
ASJC Scopus subject areas
- Condensed Matter Physics
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Liu, L., Nowak, E. R., Jaeger, H. M., Vuchic, B. V., Merkle, K. L., Buchholz, D. B., & Chang, R. P. H. (1995). High-angle grain-boundary junctions in YBa2Cu3O7: Normal-state resistance and 1/f noise. Physical Review B, 51(22), 16164-16167. https://doi.org/10.1103/PhysRevB.51.16164