High-angle grain-boundary junctions in YBa2Cu3O7

Normal-state resistance and 1/f noise

Li Liu, E. R. Nowak, H. M. Jaeger, B. V. Vuchic, K. L. Merkle, D. B. Buchholz, Robert P. H. Chang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We have investigated the normal-state resistance and the excess low-frequency (1/f) noise in 45°tilt [001] grain-boundary junctions in YBa2Cu3O7 thin films. A characteristic temperature dependence of the resistance fluctuations and a linear temperature dependence of the grain-boundary resistance (with a negative temperature coefficient) emerge as common features. These observations are quantitatively compared with a model of many, parallel conduction paths across the boundary, taking into account both temperature-independent and thermally activated transport processes.

Original languageEnglish
Pages (from-to)16164-16167
Number of pages4
JournalPhysical Review B
Volume51
Issue number22
DOIs
Publication statusPublished - 1995

Fingerprint

Grain boundaries
grain boundaries
Negative temperature coefficient
temperature dependence
Temperature
low frequencies
conduction
Thin films
temperature
coefficients
thin films
barium copper yttrium oxide

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Liu, L., Nowak, E. R., Jaeger, H. M., Vuchic, B. V., Merkle, K. L., Buchholz, D. B., & Chang, R. P. H. (1995). High-angle grain-boundary junctions in YBa2Cu3O7: Normal-state resistance and 1/f noise. Physical Review B, 51(22), 16164-16167. https://doi.org/10.1103/PhysRevB.51.16164

High-angle grain-boundary junctions in YBa2Cu3O7 : Normal-state resistance and 1/f noise. / Liu, Li; Nowak, E. R.; Jaeger, H. M.; Vuchic, B. V.; Merkle, K. L.; Buchholz, D. B.; Chang, Robert P. H.

In: Physical Review B, Vol. 51, No. 22, 1995, p. 16164-16167.

Research output: Contribution to journalArticle

Liu, L, Nowak, ER, Jaeger, HM, Vuchic, BV, Merkle, KL, Buchholz, DB & Chang, RPH 1995, 'High-angle grain-boundary junctions in YBa2Cu3O7: Normal-state resistance and 1/f noise', Physical Review B, vol. 51, no. 22, pp. 16164-16167. https://doi.org/10.1103/PhysRevB.51.16164
Liu L, Nowak ER, Jaeger HM, Vuchic BV, Merkle KL, Buchholz DB et al. High-angle grain-boundary junctions in YBa2Cu3O7: Normal-state resistance and 1/f noise. Physical Review B. 1995;51(22):16164-16167. https://doi.org/10.1103/PhysRevB.51.16164
Liu, Li ; Nowak, E. R. ; Jaeger, H. M. ; Vuchic, B. V. ; Merkle, K. L. ; Buchholz, D. B. ; Chang, Robert P. H. / High-angle grain-boundary junctions in YBa2Cu3O7 : Normal-state resistance and 1/f noise. In: Physical Review B. 1995 ; Vol. 51, No. 22. pp. 16164-16167.
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