Abstract
We have investigated the normal-state resistance and the excess low-frequency (1/f) noise in 45°tilt [001] grain-boundary junctions in YBa2Cu3O7 thin films. A characteristic temperature dependence of the resistance fluctuations and a linear temperature dependence of the grain-boundary resistance (with a negative temperature coefficient) emerge as common features. These observations are quantitatively compared with a model of many, parallel conduction paths across the boundary, taking into account both temperature-independent and thermally activated transport processes.
| Original language | English |
|---|---|
| Pages (from-to) | 16164-16167 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 51 |
| Issue number | 22 |
| DOIs | |
| Publication status | Published - 1995 |
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ASJC Scopus subject areas
- Condensed Matter Physics
Cite this
High-angle grain-boundary junctions in YBa2Cu3O7 : Normal-state resistance and 1/f noise. / Liu, Li; Nowak, E. R.; Jaeger, H. M.; Vuchic, B. V.; Merkle, K. L.; Buchholz, D. B.; Chang, Robert P. H.
In: Physical Review B, Vol. 51, No. 22, 1995, p. 16164-16167.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - High-angle grain-boundary junctions in YBa2Cu3O7
T2 - Normal-state resistance and 1/f noise
AU - Liu, Li
AU - Nowak, E. R.
AU - Jaeger, H. M.
AU - Vuchic, B. V.
AU - Merkle, K. L.
AU - Buchholz, D. B.
AU - Chang, Robert P. H.
PY - 1995
Y1 - 1995
N2 - We have investigated the normal-state resistance and the excess low-frequency (1/f) noise in 45°tilt [001] grain-boundary junctions in YBa2Cu3O7 thin films. A characteristic temperature dependence of the resistance fluctuations and a linear temperature dependence of the grain-boundary resistance (with a negative temperature coefficient) emerge as common features. These observations are quantitatively compared with a model of many, parallel conduction paths across the boundary, taking into account both temperature-independent and thermally activated transport processes.
AB - We have investigated the normal-state resistance and the excess low-frequency (1/f) noise in 45°tilt [001] grain-boundary junctions in YBa2Cu3O7 thin films. A characteristic temperature dependence of the resistance fluctuations and a linear temperature dependence of the grain-boundary resistance (with a negative temperature coefficient) emerge as common features. These observations are quantitatively compared with a model of many, parallel conduction paths across the boundary, taking into account both temperature-independent and thermally activated transport processes.
UR - http://www.scopus.com/inward/record.url?scp=3643139230&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=3643139230&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.51.16164
DO - 10.1103/PhysRevB.51.16164
M3 - Article
VL - 51
SP - 16164
EP - 16167
JO - Physical Review B-Condensed Matter
JF - Physical Review B-Condensed Matter
SN - 1098-0121
IS - 22
ER -