High-field transport and thermal reliability of sorted carbon nanotube network devices

Ashkan Behnam, Vinod K. Sangwan, Xuanyu Zhong, Feifei Lian, David Estrada, Deep Jariwala, Alicia J. Hoag, Lincoln J. Lauhon, Tobin J Marks, Mark C Hersam, Eric Pop

Research output: Contribution to journalArticle

31 Citations (Scopus)

Abstract

We examine the high-field operation, power dissipation, and thermal reliability of sorted carbon nanotube network (CNN) devices, with 99% semiconducting nanotubes. We combine systematic electrical measurements with infrared (IR) thermal imaging and detailed Monte Carlo simulations to study high-field transport up to CNN failure by unzipping-like breakdown. We find that metallic CNNs carry peak current densities up to an order of magnitude greater than semiconducting CNNs at comparable nanotube densities. Metallic CNNs also appear to have a factor of 2 lower intrinsic thermal resistance, suggesting a lower thermal resistance at metallic nanotube junctions. The performance limits and reliability of CNNs depend on their makeup, and could be improved by carefully engineered heat dissipation through the substrate, contacts, and nanotube junctions. These results are essential for optimization of CNN devices on transparent or flexible substrates which typically have very low thermal conductivity.

Original languageEnglish
Pages (from-to)482-490
Number of pages9
JournalACS Nano
Volume7
Issue number1
DOIs
Publication statusPublished - Jan 22 2013

Fingerprint

Carbon Nanotubes
Nanotubes
Carbon nanotubes
nanotubes
carbon nanotubes
Infrared imaging
thermal resistance
Heat resistance
Substrates
Heat losses
electrical measurement
Thermal conductivity
Energy dissipation
Current density
thermal conductivity
dissipation
breakdown
current density
cooling
optimization

Keywords

  • carbon nanotube
  • electrical breakdown
  • infrared microscopy
  • nanotube junctions
  • network
  • percolation
  • power dissipation
  • thermal conductivity
  • ultracentrifugation

ASJC Scopus subject areas

  • Engineering(all)
  • Materials Science(all)
  • Physics and Astronomy(all)

Cite this

Behnam, A., Sangwan, V. K., Zhong, X., Lian, F., Estrada, D., Jariwala, D., ... Pop, E. (2013). High-field transport and thermal reliability of sorted carbon nanotube network devices. ACS Nano, 7(1), 482-490. https://doi.org/10.1021/nn304570u

High-field transport and thermal reliability of sorted carbon nanotube network devices. / Behnam, Ashkan; Sangwan, Vinod K.; Zhong, Xuanyu; Lian, Feifei; Estrada, David; Jariwala, Deep; Hoag, Alicia J.; Lauhon, Lincoln J.; Marks, Tobin J; Hersam, Mark C; Pop, Eric.

In: ACS Nano, Vol. 7, No. 1, 22.01.2013, p. 482-490.

Research output: Contribution to journalArticle

Behnam, A, Sangwan, VK, Zhong, X, Lian, F, Estrada, D, Jariwala, D, Hoag, AJ, Lauhon, LJ, Marks, TJ, Hersam, MC & Pop, E 2013, 'High-field transport and thermal reliability of sorted carbon nanotube network devices', ACS Nano, vol. 7, no. 1, pp. 482-490. https://doi.org/10.1021/nn304570u
Behnam A, Sangwan VK, Zhong X, Lian F, Estrada D, Jariwala D et al. High-field transport and thermal reliability of sorted carbon nanotube network devices. ACS Nano. 2013 Jan 22;7(1):482-490. https://doi.org/10.1021/nn304570u
Behnam, Ashkan ; Sangwan, Vinod K. ; Zhong, Xuanyu ; Lian, Feifei ; Estrada, David ; Jariwala, Deep ; Hoag, Alicia J. ; Lauhon, Lincoln J. ; Marks, Tobin J ; Hersam, Mark C ; Pop, Eric. / High-field transport and thermal reliability of sorted carbon nanotube network devices. In: ACS Nano. 2013 ; Vol. 7, No. 1. pp. 482-490.
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