High real-space resolution structure of materials by high-energy X-ray diffraction

V. Petkov, S. J L Billinge, J. Heising, Mercouri G Kanatzidis, S. D. Shastri, S. Kycia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The results of high-energy synchrotron radiation experiments are presented, demonstrating the advantages of the high-resolution atomic pair distribution function technique. The technique can be applied to investigate the atomic arrangement in completely disordered materials such as glass. InGaAs alloys are found to have little positional disorder. Both In and As atoms are found to be statically displaced from their positions in the ideal lattice. In layered dichalcogenides such as WS2, the electron diffraction study shows that the structure of single layers of WS2 is similar to that of orthorhombic WT2.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Pages151-156
Number of pages6
Volume590
Publication statusPublished - 2000
EventThe 1999 MRS Fall Meeting - Symposium R 'Applications of Synchrotron Radiation Techniques to Materials Science V' - Boston, MA, USA
Duration: Nov 29 1999Dec 3 1999

Other

OtherThe 1999 MRS Fall Meeting - Symposium R 'Applications of Synchrotron Radiation Techniques to Materials Science V'
CityBoston, MA, USA
Period11/29/9912/3/99

Fingerprint

Synchrotron radiation
Electron diffraction
Distribution functions
X ray diffraction
Glass
Atoms
Experiments

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Petkov, V., Billinge, S. J. L., Heising, J., Kanatzidis, M. G., Shastri, S. D., & Kycia, S. (2000). High real-space resolution structure of materials by high-energy X-ray diffraction. In Materials Research Society Symposium - Proceedings (Vol. 590, pp. 151-156). Materials Research Society.

High real-space resolution structure of materials by high-energy X-ray diffraction. / Petkov, V.; Billinge, S. J L; Heising, J.; Kanatzidis, Mercouri G; Shastri, S. D.; Kycia, S.

Materials Research Society Symposium - Proceedings. Vol. 590 Materials Research Society, 2000. p. 151-156.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Petkov, V, Billinge, SJL, Heising, J, Kanatzidis, MG, Shastri, SD & Kycia, S 2000, High real-space resolution structure of materials by high-energy X-ray diffraction. in Materials Research Society Symposium - Proceedings. vol. 590, Materials Research Society, pp. 151-156, The 1999 MRS Fall Meeting - Symposium R 'Applications of Synchrotron Radiation Techniques to Materials Science V', Boston, MA, USA, 11/29/99.
Petkov V, Billinge SJL, Heising J, Kanatzidis MG, Shastri SD, Kycia S. High real-space resolution structure of materials by high-energy X-ray diffraction. In Materials Research Society Symposium - Proceedings. Vol. 590. Materials Research Society. 2000. p. 151-156
Petkov, V. ; Billinge, S. J L ; Heising, J. ; Kanatzidis, Mercouri G ; Shastri, S. D. ; Kycia, S. / High real-space resolution structure of materials by high-energy X-ray diffraction. Materials Research Society Symposium - Proceedings. Vol. 590 Materials Research Society, 2000. pp. 151-156
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