High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires

Cevat Akin, Leonard C Feldman, Corentin Durand, Saban M. Hus, An Ping Li, Ho Yee Hui, Michael A. Filler, Jingang Yi, Jerry W. Shan

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Existing nanowire electrical characterization tools not only are expensive and require sophisticated facilities, but are far too slow to enable statistical characterization of highly variable samples. They are also generally not compatible with further sorting and processing of nanowires. Here, we demonstrate a high-throughput, solution-based electro-orientation-spectroscopy (EOS) method, which is capable of automated electrical characterization of individual nanowires by direct optical visualization of their alignment behavior under spatially uniform electric fields of different frequencies. We demonstrate that EOS can quantitatively characterize the electrical conductivities of nanowires over a 6-order-of-magnitude range (10-5 to 10 S m-1, corresponding to typical carrier densities of 1010-1016 cm-3), with different fluids used to suspend the nanowires. By implementing EOS in a simple microfluidic device, continuous electrical characterization is achieved, and the sorting of nanowires is demonstrated as a proof-of-concept. With measurement speeds two orders of magnitude faster than direct-contact methods, the automated EOS instrument enables for the first time the statistical characterization of highly variable 1D nanomaterials.

Original languageEnglish
Pages (from-to)2126-2134
Number of pages9
JournalLab on a Chip - Miniaturisation for Chemistry and Biology
Volume16
Issue number11
DOIs
Publication statusPublished - 2016

Fingerprint

Nanowires
Semiconductors
Microfluidics
Sorting
Throughput
Semiconductor materials
Spectrum Analysis
Spectroscopy
Lab-On-A-Chip Devices
Electric Conductivity
Nanostructures
Nanostructured materials
Carrier concentration
Visualization
Electric fields
Fluids
Processing

ASJC Scopus subject areas

  • Biochemistry
  • Chemistry(all)
  • Bioengineering
  • Biomedical Engineering

Cite this

High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires. / Akin, Cevat; Feldman, Leonard C; Durand, Corentin; Hus, Saban M.; Li, An Ping; Hui, Ho Yee; Filler, Michael A.; Yi, Jingang; Shan, Jerry W.

In: Lab on a Chip - Miniaturisation for Chemistry and Biology, Vol. 16, No. 11, 2016, p. 2126-2134.

Research output: Contribution to journalArticle

Akin, Cevat ; Feldman, Leonard C ; Durand, Corentin ; Hus, Saban M. ; Li, An Ping ; Hui, Ho Yee ; Filler, Michael A. ; Yi, Jingang ; Shan, Jerry W. / High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires. In: Lab on a Chip - Miniaturisation for Chemistry and Biology. 2016 ; Vol. 16, No. 11. pp. 2126-2134.
@article{caefa682edef4759a5af126762ae5a64,
title = "High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires",
abstract = "Existing nanowire electrical characterization tools not only are expensive and require sophisticated facilities, but are far too slow to enable statistical characterization of highly variable samples. They are also generally not compatible with further sorting and processing of nanowires. Here, we demonstrate a high-throughput, solution-based electro-orientation-spectroscopy (EOS) method, which is capable of automated electrical characterization of individual nanowires by direct optical visualization of their alignment behavior under spatially uniform electric fields of different frequencies. We demonstrate that EOS can quantitatively characterize the electrical conductivities of nanowires over a 6-order-of-magnitude range (10-5 to 10 S m-1, corresponding to typical carrier densities of 1010-1016 cm-3), with different fluids used to suspend the nanowires. By implementing EOS in a simple microfluidic device, continuous electrical characterization is achieved, and the sorting of nanowires is demonstrated as a proof-of-concept. With measurement speeds two orders of magnitude faster than direct-contact methods, the automated EOS instrument enables for the first time the statistical characterization of highly variable 1D nanomaterials.",
author = "Cevat Akin and Feldman, {Leonard C} and Corentin Durand and Hus, {Saban M.} and Li, {An Ping} and Hui, {Ho Yee} and Filler, {Michael A.} and Jingang Yi and Shan, {Jerry W.}",
year = "2016",
doi = "10.1039/c6lc00217j",
language = "English",
volume = "16",
pages = "2126--2134",
journal = "Lab on a Chip",
issn = "1473-0197",
publisher = "Royal Society of Chemistry",
number = "11",

}

TY - JOUR

T1 - High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires

AU - Akin, Cevat

AU - Feldman, Leonard C

AU - Durand, Corentin

AU - Hus, Saban M.

AU - Li, An Ping

AU - Hui, Ho Yee

AU - Filler, Michael A.

AU - Yi, Jingang

AU - Shan, Jerry W.

PY - 2016

Y1 - 2016

N2 - Existing nanowire electrical characterization tools not only are expensive and require sophisticated facilities, but are far too slow to enable statistical characterization of highly variable samples. They are also generally not compatible with further sorting and processing of nanowires. Here, we demonstrate a high-throughput, solution-based electro-orientation-spectroscopy (EOS) method, which is capable of automated electrical characterization of individual nanowires by direct optical visualization of their alignment behavior under spatially uniform electric fields of different frequencies. We demonstrate that EOS can quantitatively characterize the electrical conductivities of nanowires over a 6-order-of-magnitude range (10-5 to 10 S m-1, corresponding to typical carrier densities of 1010-1016 cm-3), with different fluids used to suspend the nanowires. By implementing EOS in a simple microfluidic device, continuous electrical characterization is achieved, and the sorting of nanowires is demonstrated as a proof-of-concept. With measurement speeds two orders of magnitude faster than direct-contact methods, the automated EOS instrument enables for the first time the statistical characterization of highly variable 1D nanomaterials.

AB - Existing nanowire electrical characterization tools not only are expensive and require sophisticated facilities, but are far too slow to enable statistical characterization of highly variable samples. They are also generally not compatible with further sorting and processing of nanowires. Here, we demonstrate a high-throughput, solution-based electro-orientation-spectroscopy (EOS) method, which is capable of automated electrical characterization of individual nanowires by direct optical visualization of their alignment behavior under spatially uniform electric fields of different frequencies. We demonstrate that EOS can quantitatively characterize the electrical conductivities of nanowires over a 6-order-of-magnitude range (10-5 to 10 S m-1, corresponding to typical carrier densities of 1010-1016 cm-3), with different fluids used to suspend the nanowires. By implementing EOS in a simple microfluidic device, continuous electrical characterization is achieved, and the sorting of nanowires is demonstrated as a proof-of-concept. With measurement speeds two orders of magnitude faster than direct-contact methods, the automated EOS instrument enables for the first time the statistical characterization of highly variable 1D nanomaterials.

UR - http://www.scopus.com/inward/record.url?scp=84971255087&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84971255087&partnerID=8YFLogxK

U2 - 10.1039/c6lc00217j

DO - 10.1039/c6lc00217j

M3 - Article

VL - 16

SP - 2126

EP - 2134

JO - Lab on a Chip

JF - Lab on a Chip

SN - 1473-0197

IS - 11

ER -