High‐Temperature Defect Structure of Lanthanum Cuprate

M. ‐Y Su, E. A. Cooper, C. E. Elsbernd, Thomas O Mason

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

High‐temperature (650° to 8507deg;C) electrical conductivity and Seebeck coefficient measurements as functions of oxygen partial pressure and temperature in polycrystalline lanthanum cuprate support a defect model consisting of oxygen interstitials charge compensated by electron holes. The La:Cu ratio was therefore estimated to be 2.000 ± 0.001. By comparison with existing oxygen nonstoichiometry data, the high‐temperature electron hole mobility and density‐of‐states were estimated.

Original languageEnglish
Pages (from-to)3453-3456
Number of pages4
JournalJournal of the American Ceramic Society
Volume73
Issue number11
DOIs
Publication statusPublished - 1990

Fingerprint

Lanthanum
Defect structures
Oxygen
Hole mobility
Seebeck coefficient
Electrons
Partial pressure
Defects
Temperature

Keywords

  • cuprates
  • defects
  • lanthanum
  • models
  • superconductors

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

Cite this

High‐Temperature Defect Structure of Lanthanum Cuprate. / Su, M. ‐Y; Cooper, E. A.; Elsbernd, C. E.; Mason, Thomas O.

In: Journal of the American Ceramic Society, Vol. 73, No. 11, 1990, p. 3453-3456.

Research output: Contribution to journalArticle

Su, M. ‐Y ; Cooper, E. A. ; Elsbernd, C. E. ; Mason, Thomas O. / High‐Temperature Defect Structure of Lanthanum Cuprate. In: Journal of the American Ceramic Society. 1990 ; Vol. 73, No. 11. pp. 3453-3456.
@article{deaf6ee31fbb492683d0da52cfdb8dd3,
title = "High‐Temperature Defect Structure of Lanthanum Cuprate",
abstract = "High‐temperature (650° to 8507deg;C) electrical conductivity and Seebeck coefficient measurements as functions of oxygen partial pressure and temperature in polycrystalline lanthanum cuprate support a defect model consisting of oxygen interstitials charge compensated by electron holes. The La:Cu ratio was therefore estimated to be 2.000 ± 0.001. By comparison with existing oxygen nonstoichiometry data, the high‐temperature electron hole mobility and density‐of‐states were estimated.",
keywords = "cuprates, defects, lanthanum, models, superconductors",
author = "Su, {M. ‐Y} and Cooper, {E. A.} and Elsbernd, {C. E.} and Mason, {Thomas O}",
year = "1990",
doi = "10.1111/j.1151-2916.1990.tb06474.x",
language = "English",
volume = "73",
pages = "3453--3456",
journal = "Journal of the American Ceramic Society",
issn = "0002-7820",
publisher = "Wiley-Blackwell",
number = "11",

}

TY - JOUR

T1 - High‐Temperature Defect Structure of Lanthanum Cuprate

AU - Su, M. ‐Y

AU - Cooper, E. A.

AU - Elsbernd, C. E.

AU - Mason, Thomas O

PY - 1990

Y1 - 1990

N2 - High‐temperature (650° to 8507deg;C) electrical conductivity and Seebeck coefficient measurements as functions of oxygen partial pressure and temperature in polycrystalline lanthanum cuprate support a defect model consisting of oxygen interstitials charge compensated by electron holes. The La:Cu ratio was therefore estimated to be 2.000 ± 0.001. By comparison with existing oxygen nonstoichiometry data, the high‐temperature electron hole mobility and density‐of‐states were estimated.

AB - High‐temperature (650° to 8507deg;C) electrical conductivity and Seebeck coefficient measurements as functions of oxygen partial pressure and temperature in polycrystalline lanthanum cuprate support a defect model consisting of oxygen interstitials charge compensated by electron holes. The La:Cu ratio was therefore estimated to be 2.000 ± 0.001. By comparison with existing oxygen nonstoichiometry data, the high‐temperature electron hole mobility and density‐of‐states were estimated.

KW - cuprates

KW - defects

KW - lanthanum

KW - models

KW - superconductors

UR - http://www.scopus.com/inward/record.url?scp=0000948363&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000948363&partnerID=8YFLogxK

U2 - 10.1111/j.1151-2916.1990.tb06474.x

DO - 10.1111/j.1151-2916.1990.tb06474.x

M3 - Article

VL - 73

SP - 3453

EP - 3456

JO - Journal of the American Ceramic Society

JF - Journal of the American Ceramic Society

SN - 0002-7820

IS - 11

ER -