Abstract
A study of 4He backscattering (150°) cross sections for O, Al, and Si atoms in the energy range 0.6-2.3 MeV has been completed. We conclude that the 4He backscattering cross section for these elements follows the E-2 energy dependence of Rutherford backscattering to 1%-2% over this energy range. These results have significant implications for the use of 4He backscattering as a materials analysis tool for low-Z elements.
Original language | English |
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Pages (from-to) | 1800-1803 |
Number of pages | 4 |
Journal | Journal of Applied Physics |
Volume | 54 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1983 |
ASJC Scopus subject areas
- Physics and Astronomy(all)