In-plane orientation control of (001)YBa2Cu3O7-δ grown on (001)MgO by pulsed organometallic beam epitaxy

D. B. Buchholz, J. S. Lei, S. Mahajan, P. R. Markworth, R. P.H. Chang, B. Hinds, T. J. Marks, J. L. Schindler, C. R. Kannewurf, Y. Huang, K. L. Merkle

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11 Citations (Scopus)

Abstract

Thin films of (001) YBCO are grown on epitaxially polished (001) MgO by pulsed organometallic beam epitaxy. The in-plane orientation of the film is controlled by the thickness of a BaO layer, grown in situ, prior to the YBCO growth. For thin BaO layers (<≊7×1014 Ba/cm2) the films grown [110]YBCO∥[100]MgO. For thick BaO layers (≳≊11×1014 Ba/cm2) the films grow [100]YBCO∥[100]MgO. A mechanism that relates the change in YBCO in-plane orientation to a change in the structure of the initial BaO layers with BaO thickness is described.

Original languageEnglish
Pages (from-to)3037-3039
Number of pages3
JournalApplied Physics Letters
Volume68
Issue number21
DOIs
Publication statusPublished - 1996

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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