In situ deposition and XPS characterization of lithium based solid glass electrolyte/vanadia interfaces: Observation of lithium migration

D. A. Hensley, Steve Garofalini

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

In situ X-ray Photoelectron Spectroscopy (XPS) was used to examine the interfaces formed by reactive sputter deposition of vanadia onto several lithium based solid glass electrolytes. It has been found that lithium migration to the vanadia/vacuum interface can occur during deposition and that the presence of lithium can influence the oxygen uptake during the reactive sputtering process. The lithium migration is driven by an electric field present due to the plasma; it is shown that the migration can be influenced by the deposition conditions.

Original languageEnglish
Pages (from-to)67-73
Number of pages7
JournalSolid State Ionics
Volume82
Issue number1-2
DOIs
Publication statusPublished - Nov 15 1995

Keywords

  • Interfacial lithium migration
  • Lithium phosphate
  • Lithium phosphorus oxynitride
  • Vanadium pentoxide
  • XPS

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Electrochemistry
  • Physical and Theoretical Chemistry
  • Energy Engineering and Power Technology
  • Materials Chemistry

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