In situ deposition and XPS characterization of lithium based solid glass electrolyte/vanadia interfaces: Observation of lithium migration

D. A. Hensley; Steve Garofalini

doi:10.1016/0167-2738(95)00191-8

In situ deposition and XPS characterization of lithium based solid glass electrolyte/vanadia interfaces: Observation of lithium migration

D. A. Hensley, Steve Garofalini

Rutgers University

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

In situ X-ray Photoelectron Spectroscopy (XPS) was used to examine the interfaces formed by reactive sputter deposition of vanadia onto several lithium based solid glass electrolytes. It has been found that lithium migration to the vanadia/vacuum interface can occur during deposition and that the presence of lithium can influence the oxygen uptake during the reactive sputtering process. The lithium migration is driven by an electric field present due to the plasma; it is shown that the migration can be influenced by the deposition conditions.

Original language	English
Pages (from-to)	67-73
Number of pages	7
Journal	Solid State Ionics
Volume	82
Issue number	1-2
DOIs	https://doi.org/10.1016/0167-2738(95)00191-8
Publication status	Published - Nov 15 1995

Keywords

Interfacial lithium migration
Lithium phosphate
Lithium phosphorus oxynitride
Vanadium pentoxide
XPS

ASJC Scopus subject areas

Chemistry(all)
Materials Science(all)
Condensed Matter Physics
Electrochemistry
Physical and Theoretical Chemistry
Energy Engineering and Power Technology
Materials Chemistry

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10.1016/0167-2738(95)00191-8

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Hensley, D. A., & Garofalini, S. (1995). In situ deposition and XPS characterization of lithium based solid glass electrolyte/vanadia interfaces: Observation of lithium migration. Solid State Ionics, 82(1-2), 67-73. https://doi.org/10.1016/0167-2738(95)00191-8

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