Abstract
In situ X-ray Photoelectron Spectroscopy (XPS) was used to examine the interfaces formed by reactive sputter deposition of vanadia onto several lithium based solid glass electrolytes. It has been found that lithium migration to the vanadia/vacuum interface can occur during deposition and that the presence of lithium can influence the oxygen uptake during the reactive sputtering process. The lithium migration is driven by an electric field present due to the plasma; it is shown that the migration can be influenced by the deposition conditions.
| Original language | English |
|---|---|
| Pages (from-to) | 67-73 |
| Number of pages | 7 |
| Journal | Solid State Ionics |
| Volume | 82 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - Nov 15 1995 |
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Keywords
- Interfacial lithium migration
- Lithium phosphate
- Lithium phosphorus oxynitride
- Vanadium pentoxide
- XPS
ASJC Scopus subject areas
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics
- Electrochemistry
- Physical and Theoretical Chemistry
- Energy Engineering and Power Technology
- Materials Chemistry
Cite this
In situ deposition and XPS characterization of lithium based solid glass electrolyte/vanadia interfaces : Observation of lithium migration. / Hensley, D. A.; Garofalini, Steve.
In: Solid State Ionics, Vol. 82, No. 1-2, 15.11.1995, p. 67-73.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - In situ deposition and XPS characterization of lithium based solid glass electrolyte/vanadia interfaces
T2 - Observation of lithium migration
AU - Hensley, D. A.
AU - Garofalini, Steve
PY - 1995/11/15
Y1 - 1995/11/15
N2 - In situ X-ray Photoelectron Spectroscopy (XPS) was used to examine the interfaces formed by reactive sputter deposition of vanadia onto several lithium based solid glass electrolytes. It has been found that lithium migration to the vanadia/vacuum interface can occur during deposition and that the presence of lithium can influence the oxygen uptake during the reactive sputtering process. The lithium migration is driven by an electric field present due to the plasma; it is shown that the migration can be influenced by the deposition conditions.
AB - In situ X-ray Photoelectron Spectroscopy (XPS) was used to examine the interfaces formed by reactive sputter deposition of vanadia onto several lithium based solid glass electrolytes. It has been found that lithium migration to the vanadia/vacuum interface can occur during deposition and that the presence of lithium can influence the oxygen uptake during the reactive sputtering process. The lithium migration is driven by an electric field present due to the plasma; it is shown that the migration can be influenced by the deposition conditions.
KW - Interfacial lithium migration
KW - Lithium phosphate
KW - Lithium phosphorus oxynitride
KW - Vanadium pentoxide
KW - XPS
UR - http://www.scopus.com/inward/record.url?scp=0029405042&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0029405042&partnerID=8YFLogxK
U2 - 10.1016/0167-2738(95)00191-8
DO - 10.1016/0167-2738(95)00191-8
M3 - Article
AN - SCOPUS:0029405042
VL - 82
SP - 67
EP - 73
JO - Solid State Ionics
JF - Solid State Ionics
SN - 0167-2738
IS - 1-2
ER -