In situ, real-time analysis of the growth of ferroelectric and conductive oxide heterostructures by a new time-of-flight pulsed ion beam surface analysis technique

Orlando Auciello, A. R. Krauss, Y. Lin, R. P.H. Chang, D. M. Gruen

Research output: Contribution to journalConference articlepeer-review

9 Citations (Scopus)

Fingerprint Dive into the research topics of 'In situ, real-time analysis of the growth of ferroelectric and conductive oxide heterostructures by a new time-of-flight pulsed ion beam surface analysis technique'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy