In situ x-ray diffraction studies of YBa2Cu3O x/LaAlO3 interfaces

S. M. Williams, X. K. Wang, S. Maglic, T. S. Toellner, C. T. Lin, M. D. Cavanagh, S. J. Duray, P. M. Lundquist, Robert P. H. Chang, J. B. Ketterson

Research output: Contribution to journal › Article

1 Citation (Scopus)

Abstract

We report on the oriented growth by sputtering of YBCO/LaAlO 3/YBCO S/I/S trilayers and YBCO/LaAlO3 multilayers using a new synchrotron compatible multisource deposition chamber.

Original languageEnglish
Pages (from-to)5372-5374
Number of pages3
JournalJournal of Applied Physics
Volume75
Issue number10
DOIs
Publication statusPublished - 1994

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synchrotrons
x ray diffraction
chambers
sputtering

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Williams, S. M., Wang, X. K., Maglic, S., Toellner, T. S., Lin, C. T., Cavanagh, M. D., ... Ketterson, J. B. (1994). In situ x-ray diffraction studies of YBa2Cu3O x/LaAlO3 interfaces. Journal of Applied Physics, 75(10), 5372-5374. https://doi.org/10.1063/1.355691

In situ x-ray diffraction studies of YBa2Cu3O x/LaAlO3 interfaces. / Williams, S. M.; Wang, X. K.; Maglic, S.; Toellner, T. S.; Lin, C. T.; Cavanagh, M. D.; Duray, S. J.; Lundquist, P. M.; Chang, Robert P. H.; Ketterson, J. B.

In: Journal of Applied Physics, Vol. 75, No. 10, 1994, p. 5372-5374.

Research output: Contribution to journal › Article

Williams, SM, Wang, XK, Maglic, S, Toellner, TS, Lin, CT, Cavanagh, MD, Duray, SJ, Lundquist, PM, Chang, RPH & Ketterson, JB 1994, 'In situ x-ray diffraction studies of YBa2Cu3O x/LaAlO3 interfaces', Journal of Applied Physics, vol. 75, no. 10, pp. 5372-5374. https://doi.org/10.1063/1.355691
Williams SM, Wang XK, Maglic S, Toellner TS, Lin CT, Cavanagh MD et al. In situ x-ray diffraction studies of YBa2Cu3O x/LaAlO3 interfaces. Journal of Applied Physics. 1994;75(10):5372-5374. https://doi.org/10.1063/1.355691
Williams, S. M. ; Wang, X. K. ; Maglic, S. ; Toellner, T. S. ; Lin, C. T. ; Cavanagh, M. D. ; Duray, S. J. ; Lundquist, P. M. ; Chang, Robert P. H. ; Ketterson, J. B. / In situ x-ray diffraction studies of YBa2Cu3O x/LaAlO3 interfaces. In: Journal of Applied Physics. 1994 ; Vol. 75, No. 10. pp. 5372-5374.
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AU - Ketterson, J. B.

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