In situ x-ray diffraction studies of YBa2Cu3O x/LaAlO3 interfaces

S. M. Williams, X. K. Wang, S. Maglic, T. S. Toellner, C. T. Lin, M. D. Cavanagh, S. J. Duray, P. M. Lundquist, Robert P. H. Chang, J. B. Ketterson

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Abstract

We report on the oriented growth by sputtering of YBCO/LaAlO 3/YBCO S/I/S trilayers and YBCO/LaAlO3 multilayers using a new synchrotron compatible multisource deposition chamber.

Original languageEnglish
Pages (from-to)5372-5374
Number of pages3
JournalJournal of Applied Physics
Volume75
Issue number10
DOIs
Publication statusPublished - 1994

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Williams, S. M., Wang, X. K., Maglic, S., Toellner, T. S., Lin, C. T., Cavanagh, M. D., Duray, S. J., Lundquist, P. M., Chang, R. P. H., & Ketterson, J. B. (1994). In situ x-ray diffraction studies of YBa2Cu3O x/LaAlO3 interfaces. Journal of Applied Physics, 75(10), 5372-5374. https://doi.org/10.1063/1.355691