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Increase in oxide hole trap density associated with nitrogen incorporation at the SiO2 /SiC interface
John Rozen, Sarit Dhar, S. K. Dixit, V. V. Afanas'Ev, F. O. Roberts, H. L. Dang, Sanwu Wang, S. T. Pantelides, J. R. Williams, L. C. Feldman
Research output: Contribution to journal › Article › peer-review
53
Citations
(Scopus)