Inelastic relaxation in Gd-doped ceria films: Micro-Raman spectroscopy

Olga Kraynis, Ellen Wachtel, Igor Lubomirsky, Tsachi Livneh

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)


Micro-Raman spectroscopy and X-ray diffraction were used to study time-dependent structural changes in sputtered Ce1-xGdxO2-x/2 films. The F 2g peak position was measured at five well-defined film locations; X-ray diffraction assessed in-plane compressive strain and unit cell volume. For x=0.05, at all locations monitored post-annealing, the F 2g frequency continued to increase during two weeks and for x=0.10, at 4 of 5 locations during six weeks. This time-dependent behavior is attributed to relaxation of local elastic dipolar strain fields. Raman spectroscopy can properly evaluate strain in thin films of these materials only when mechanical properties, defect structure, temporal and thermal history are considered.

Original languageEnglish
JournalScripta Materialia
Publication statusAccepted/In press - Dec 11 2016


  • Anelastic relaxation
  • Gd-doped ceria
  • Raman spectroscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Inelastic relaxation in Gd-doped ceria films: Micro-Raman spectroscopy'. Together they form a unique fingerprint.

Cite this