Influence of weak links and oxygen deficiency on electrical properties of Bi-2212 and Ti-2212 HTS thin films

Jon L. Schindler; Frank DiMeo; Carolyn R. Duran; Bruce J. Hinds; Bruce W. Wessels; Tobin J Marks; Carl R. Kannewurf

Influence of weak links and oxygen deficiency on electrical properties of Bi-2212 and Ti-2212 HTS thin films

Jon L. Schindler, Frank DiMeo, Carolyn R. Duran, Bruce J. Hinds, Bruce W. Wessels, Tobin J Marks, Carl R. Kannewurf

Northwestern University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Thin films of the Bi-2212 and Tl-2212 compounds were prepared by MOCVD deposition techniques. Resistivity versus temperature and critical current density measurements were used to characterize the electrical properties. An analysis of the data based on a proposed model determined the influence of intragranular weak links. Thin film samples in both systems with near optimum oxygen doping showed a correlation between the slope and magnitude of the resistivity in the normal state. Samples with reduced oxygen content displayed a strong increase in the intragrain boundary resistance, consistent with weak link defects. The results agree with a similar analysis of YBCO samples and support a common mechanism for the development of weak links in cuprates.

Original language	English
Title of host publication	Materials Research Society Symposium - Proceedings
Publisher	Materials Research Society
Pages	315-320
Number of pages	6
Volume	401
Publication status	Published - 1996
Event	Proceedings of the 1995 MRS Fall Symposium - Boston, MA, USA Duration: Nov 27 1995 → Nov 30 1995

Other

Other	Proceedings of the 1995 MRS Fall Symposium
City	Boston, MA, USA
Period	11/27/95 → 11/30/95

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

Access to Document

Fingerprint Dive into the research topics of 'Influence of weak links and oxygen deficiency on electrical properties of Bi-2212 and Ti-2212 HTS thin films'. Together they form a unique fingerprint.

Cite this

Influence of weak links and oxygen deficiency on electrical properties of Bi-2212 and Ti-2212 HTS thin films. / Schindler, Jon L.; DiMeo, Frank; Duran, Carolyn R.; Hinds, Bruce J.; Wessels, Bruce W.; Marks, Tobin J; Kannewurf, Carl R.

Materials Research Society Symposium - Proceedings. Vol. 401 Materials Research Society, 1996. p. 315-320.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Schindler, JL, DiMeo, F, Duran, CR, Hinds, BJ, Wessels, BW, Marks, TJ & Kannewurf, CR 1996, Influence of weak links and oxygen deficiency on electrical properties of Bi-2212 and Ti-2212 HTS thin films. in Materials Research Society Symposium - Proceedings. vol. 401, Materials Research Society, pp. 315-320, Proceedings of the 1995 MRS Fall Symposium, Boston, MA, USA, 11/27/95.

@inproceedings{7210132ab69a4f11b5fdad4866a19848,

title = "Influence of weak links and oxygen deficiency on electrical properties of Bi-2212 and Ti-2212 HTS thin films",

abstract = "Thin films of the Bi-2212 and Tl-2212 compounds were prepared by MOCVD deposition techniques. Resistivity versus temperature and critical current density measurements were used to characterize the electrical properties. An analysis of the data based on a proposed model determined the influence of intragranular weak links. Thin film samples in both systems with near optimum oxygen doping showed a correlation between the slope and magnitude of the resistivity in the normal state. Samples with reduced oxygen content displayed a strong increase in the intragrain boundary resistance, consistent with weak link defects. The results agree with a similar analysis of YBCO samples and support a common mechanism for the development of weak links in cuprates.",

author = "Schindler, {Jon L.} and Frank DiMeo and Duran, {Carolyn R.} and Hinds, {Bruce J.} and Wessels, {Bruce W.} and Marks, {Tobin J} and Kannewurf, {Carl R.}",

year = "1996",

language = "English",

volume = "401",

pages = "315--320",

booktitle = "Materials Research Society Symposium - Proceedings",

publisher = "Materials Research Society",

note = "Proceedings of the 1995 MRS Fall Symposium ; Conference date: 27-11-1995 Through 30-11-1995",

}

TY - GEN

T1 - Influence of weak links and oxygen deficiency on electrical properties of Bi-2212 and Ti-2212 HTS thin films

AU - Schindler, Jon L.

AU - DiMeo, Frank

AU - Duran, Carolyn R.

AU - Hinds, Bruce J.

AU - Wessels, Bruce W.

AU - Marks, Tobin J

AU - Kannewurf, Carl R.

PY - 1996

Y1 - 1996

N2 - Thin films of the Bi-2212 and Tl-2212 compounds were prepared by MOCVD deposition techniques. Resistivity versus temperature and critical current density measurements were used to characterize the electrical properties. An analysis of the data based on a proposed model determined the influence of intragranular weak links. Thin film samples in both systems with near optimum oxygen doping showed a correlation between the slope and magnitude of the resistivity in the normal state. Samples with reduced oxygen content displayed a strong increase in the intragrain boundary resistance, consistent with weak link defects. The results agree with a similar analysis of YBCO samples and support a common mechanism for the development of weak links in cuprates.

AB - Thin films of the Bi-2212 and Tl-2212 compounds were prepared by MOCVD deposition techniques. Resistivity versus temperature and critical current density measurements were used to characterize the electrical properties. An analysis of the data based on a proposed model determined the influence of intragranular weak links. Thin film samples in both systems with near optimum oxygen doping showed a correlation between the slope and magnitude of the resistivity in the normal state. Samples with reduced oxygen content displayed a strong increase in the intragrain boundary resistance, consistent with weak link defects. The results agree with a similar analysis of YBCO samples and support a common mechanism for the development of weak links in cuprates.

UR - http://www.scopus.com/inward/record.url?scp=0029733206&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029733206&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0029733206

VL - 401

SP - 315

EP - 320

BT - Materials Research Society Symposium - Proceedings

PB - Materials Research Society

T2 - Proceedings of the 1995 MRS Fall Symposium

Y2 - 27 November 1995 through 30 November 1995

ER -