Interface Characterization and Control of 2D Materials and Heterostructures

Xiaolong Liu, Mark C Hersam

Research output: Contribution to journalReview article

16 Citations (Scopus)

Abstract

2D materials and heterostructures have attracted significant attention for a variety of nanoelectronic and optoelectronic applications. At the atomically thin limit, the material characteristics and functionalities are dominated by surface chemistry and interface coupling. Therefore, methods for comprehensively characterizing and precisely controlling surfaces and interfaces are required to realize the full technological potential of 2D materials. Here, the surface and interface properties that govern the performance of 2D materials are introduced. Then the experimental approaches that resolve surface and interface phenomena down to the atomic scale, as well as strategies that allow tuning and optimization of interfacial interactions in van der Waals heterostructures, are systematically reviewed. Finally, a future outlook that delineates the remaining challenges and opportunities for 2D material interface characterization and control is presented.

Original languageEnglish
Article number1801586
JournalAdvanced Materials
Volume30
Issue number39
DOIs
Publication statusPublished - Sep 26 2018

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Heterojunctions
Nanoelectronics
Surface chemistry
Optoelectronic devices
Tuning

Keywords

  • 2D materials
  • characterization
  • heterostructures
  • interfaces
  • surface science

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Interface Characterization and Control of 2D Materials and Heterostructures. / Liu, Xiaolong; Hersam, Mark C.

In: Advanced Materials, Vol. 30, No. 39, 1801586, 26.09.2018.

Research output: Contribution to journalReview article

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