Interface characterization in III-V CMOS nanoelectronics

L. V. Goncharova, O. Celik, T. Gustafsson, E. Garfunkel, M. Warusawithana, D. G. Schlom, H. Wen, M. B. Santos, Safak Sayan, Wilman Tsai, Niti Goel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Fingerprint Dive into the research topics of 'Interface characterization in III-V CMOS nanoelectronics'. Together they form a unique fingerprint.

Engineering & Materials Science