Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy

M. F. Lichterman, M. H. Richter, S. Hu, E. J. Crumlin, S. Axnanda, M. Favaro, W. Drisdell, Z. Hussain, T. Mayer, B. S. Brunschwig, Nathan S Lewis, Z. Liu, H. J. Lewerenz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Semiconductor-electrolyte interfaces allow for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate herein that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.

Original languageEnglish
Title of host publicationECS Transactions
PublisherElectrochemical Society Inc.
Pages97-103
Number of pages7
Volume66
Edition6
ISBN (Print)9781607685395
DOIs
Publication statusPublished - 2015
EventSymposium on Processes at the Semiconductor Solution Interface 6 - 227th ECS Meeting - Chicago, United States
Duration: May 24 2015May 28 2015

Other

OtherSymposium on Processes at the Semiconductor Solution Interface 6 - 227th ECS Meeting
CountryUnited States
CityChicago
Period5/24/155/28/15

Fingerprint

X ray photoelectron spectroscopy
Electrolytes
Semiconductor materials
Photoelectrons
Electrochemical electrodes
Binding energy
Kinetic energy
X rays
Electrodes
Electric potential
Metals

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Lichterman, M. F., Richter, M. H., Hu, S., Crumlin, E. J., Axnanda, S., Favaro, M., ... Lewerenz, H. J. (2015). Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy. In ECS Transactions (6 ed., Vol. 66, pp. 97-103). Electrochemical Society Inc.. https://doi.org/10.1149/06606.0097ecst

Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy. / Lichterman, M. F.; Richter, M. H.; Hu, S.; Crumlin, E. J.; Axnanda, S.; Favaro, M.; Drisdell, W.; Hussain, Z.; Mayer, T.; Brunschwig, B. S.; Lewis, Nathan S; Liu, Z.; Lewerenz, H. J.

ECS Transactions. Vol. 66 6. ed. Electrochemical Society Inc., 2015. p. 97-103.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lichterman, MF, Richter, MH, Hu, S, Crumlin, EJ, Axnanda, S, Favaro, M, Drisdell, W, Hussain, Z, Mayer, T, Brunschwig, BS, Lewis, NS, Liu, Z & Lewerenz, HJ 2015, Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy. in ECS Transactions. 6 edn, vol. 66, Electrochemical Society Inc., pp. 97-103, Symposium on Processes at the Semiconductor Solution Interface 6 - 227th ECS Meeting, Chicago, United States, 5/24/15. https://doi.org/10.1149/06606.0097ecst
Lichterman MF, Richter MH, Hu S, Crumlin EJ, Axnanda S, Favaro M et al. Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy. In ECS Transactions. 6 ed. Vol. 66. Electrochemical Society Inc. 2015. p. 97-103 https://doi.org/10.1149/06606.0097ecst
Lichterman, M. F. ; Richter, M. H. ; Hu, S. ; Crumlin, E. J. ; Axnanda, S. ; Favaro, M. ; Drisdell, W. ; Hussain, Z. ; Mayer, T. ; Brunschwig, B. S. ; Lewis, Nathan S ; Liu, Z. ; Lewerenz, H. J. / Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy. ECS Transactions. Vol. 66 6. ed. Electrochemical Society Inc., 2015. pp. 97-103
@inproceedings{11d748002d594a04a9d7b947a9ecd8cd,
title = "Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy",
abstract = "Semiconductor-electrolyte interfaces allow for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate herein that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.",
author = "Lichterman, {M. F.} and Richter, {M. H.} and S. Hu and Crumlin, {E. J.} and S. Axnanda and M. Favaro and W. Drisdell and Z. Hussain and T. Mayer and Brunschwig, {B. S.} and Lewis, {Nathan S} and Z. Liu and Lewerenz, {H. J.}",
year = "2015",
doi = "10.1149/06606.0097ecst",
language = "English",
isbn = "9781607685395",
volume = "66",
pages = "97--103",
booktitle = "ECS Transactions",
publisher = "Electrochemical Society Inc.",
edition = "6",

}

TY - GEN

T1 - Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy

AU - Lichterman, M. F.

AU - Richter, M. H.

AU - Hu, S.

AU - Crumlin, E. J.

AU - Axnanda, S.

AU - Favaro, M.

AU - Drisdell, W.

AU - Hussain, Z.

AU - Mayer, T.

AU - Brunschwig, B. S.

AU - Lewis, Nathan S

AU - Liu, Z.

AU - Lewerenz, H. J.

PY - 2015

Y1 - 2015

N2 - Semiconductor-electrolyte interfaces allow for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate herein that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.

AB - Semiconductor-electrolyte interfaces allow for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate herein that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.

UR - http://www.scopus.com/inward/record.url?scp=84931024104&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84931024104&partnerID=8YFLogxK

U2 - 10.1149/06606.0097ecst

DO - 10.1149/06606.0097ecst

M3 - Conference contribution

AN - SCOPUS:84931024104

SN - 9781607685395

VL - 66

SP - 97

EP - 103

BT - ECS Transactions

PB - Electrochemical Society Inc.

ER -