Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy

M. F. Lichterman, M. H. Richter, S. Hu, E. J. Crumlin, S. Axnanda, M. Favaro, W. Drisdell, Z. Hussain, T. Mayer, B. S. Brunschwig, N. S. Lewis, Z. Liu, H. J. Lewerenz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Semiconductor-electrolyte interfaces allow for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate herein that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.

Original languageEnglish
Title of host publicationProcesses at the Semiconductor Solution Interface 6
EditorsC. O'Dwyer, D. N. Buckley, A. Etcheberry, A. C. Hillier, R. P. Lynch, P. M. Vereecken, H. Wang, O. M. Leonte
PublisherElectrochemical Society Inc.
Pages97-103
Number of pages7
Edition6
ISBN (Electronic)9781607685395
DOIs
Publication statusPublished - Jan 1 2015
EventSymposium on Processes at the Semiconductor Solution Interface 6 - 227th ECS Meeting - Chicago, United States
Duration: May 24 2015May 28 2015

Publication series

NameECS Transactions
Number6
Volume66
ISSN (Print)1938-6737
ISSN (Electronic)1938-5862

Other

OtherSymposium on Processes at the Semiconductor Solution Interface 6 - 227th ECS Meeting
CountryUnited States
CityChicago
Period5/24/155/28/15

ASJC Scopus subject areas

  • Engineering(all)

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