Abstract
The chemical and structural properties of epitaxial Y1Ba2Cu3(F)O thin films, fabricated by multilayer electron beam evaporation, are evaluated, both laterally and vertically, as a function of various annealing schedules by secondary ion mass spectrometry (SIMS) using a high resolution scanning ion microprobe. The presence of residual F is related to the superconducting transition temperature of these materials.
| Original language | English |
|---|---|
| Pages (from-to) | 75-76 |
| Number of pages | 2 |
| Journal | Physica C: Superconductivity and its Applications |
| Volume | 162-164 |
| Issue number | PART 1 |
| DOIs | |
| Publication status | Published - 1989 |
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ASJC Scopus subject areas
- Condensed Matter Physics
Cite this
Ion microprobe characterization of e-beam deposited YBaCu(F)O films : Effects of post-deposition processing. / Chabala, J. M.; Chang, Robert P. H.; Ketterson, J. B.; Levi-Setti, R.; Li, D. X.; Wang, Y. L.; Wang, X. K.
In: Physica C: Superconductivity and its Applications, Vol. 162-164, No. PART 1, 1989, p. 75-76.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Ion microprobe characterization of e-beam deposited YBaCu(F)O films
T2 - Effects of post-deposition processing
AU - Chabala, J. M.
AU - Chang, Robert P. H.
AU - Ketterson, J. B.
AU - Levi-Setti, R.
AU - Li, D. X.
AU - Wang, Y. L.
AU - Wang, X. K.
PY - 1989
Y1 - 1989
N2 - The chemical and structural properties of epitaxial Y1Ba2Cu3(F)O thin films, fabricated by multilayer electron beam evaporation, are evaluated, both laterally and vertically, as a function of various annealing schedules by secondary ion mass spectrometry (SIMS) using a high resolution scanning ion microprobe. The presence of residual F is related to the superconducting transition temperature of these materials.
AB - The chemical and structural properties of epitaxial Y1Ba2Cu3(F)O thin films, fabricated by multilayer electron beam evaporation, are evaluated, both laterally and vertically, as a function of various annealing schedules by secondary ion mass spectrometry (SIMS) using a high resolution scanning ion microprobe. The presence of residual F is related to the superconducting transition temperature of these materials.
UR - http://www.scopus.com/inward/record.url?scp=0024875669&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0024875669&partnerID=8YFLogxK
U2 - 10.1016/0921-4534(89)90924-6
DO - 10.1016/0921-4534(89)90924-6
M3 - Article
VL - 162-164
SP - 75
EP - 76
JO - Physica C: Superconductivity and its Applications
JF - Physica C: Superconductivity and its Applications
SN - 0921-4534
IS - PART 1
ER -