Ion microprobe characterization of e-beam deposited YBaCu(F)O films: Effects of post-deposition processing

J. M. Chabala, Robert P. H. Chang, J. B. Ketterson, R. Levi-Setti, D. X. Li, Y. L. Wang, X. K. Wang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Fingerprint Dive into the research topics of 'Ion microprobe characterization of e-beam deposited YBaCu(F)O films: Effects of post-deposition processing'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy