Abstract
High energy ion scattering, important in the evolving understanding of interfaces and epitaxial growth, has been treated in a number of reviews describing the fundamentals of this technique and its application. A guide to the existing literature and current directions of research is presented.
| Original language | English |
|---|---|
| Pages (from-to) | 51-54 |
| Number of pages | 4 |
| Journal | Ultramicroscopy |
| Volume | 14 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - 1984 |
ASJC Scopus subject areas
- Materials Science(all)
- Instrumentation
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Cite this
Feldman, L. C. (1984). Ion scattering analysis of interfaces. Ultramicroscopy, 14(1-2), 51-54. https://doi.org/10.1016/0304-3991(84)90106-2