Ion scattering analysis of interfaces

Research output: Contribution to journalArticle

Abstract

High energy ion scattering, important in the evolving understanding of interfaces and epitaxial growth, has been treated in a number of reviews describing the fundamentals of this technique and its application. A guide to the existing literature and current directions of research is presented.

Original languageEnglish
Pages (from-to)51-54
Number of pages4
JournalUltramicroscopy
Volume14
Issue number1-2
DOIs
Publication statusPublished - 1984

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

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