Ion scattering analysis of interfaces

Leonard C Feldman

doi:10.1016/0304-3991(84)90106-2

Ion scattering analysis of interfaces

Leonard C Feldman

Rutgers University

Research output: Contribution to journal › Article › peer-review

Abstract

High energy ion scattering, important in the evolving understanding of interfaces and epitaxial growth, has been treated in a number of reviews describing the fundamentals of this technique and its application. A guide to the existing literature and current directions of research is presented.

Original language	English
Pages (from-to)	51-54
Number of pages	4
Journal	Ultramicroscopy
Volume	14
Issue number	1-2
DOIs	https://doi.org/10.1016/0304-3991(84)90106-2
Publication status	Published - 1984

ASJC Scopus subject areas

Materials Science(all)
Instrumentation

Access to Document

10.1016/0304-3991(84)90106-2

Fingerprint Dive into the research topics of 'Ion scattering analysis of interfaces'. Together they form a unique fingerprint.

Cite this

@article{6479684f30734dadba04edcd93332ff6,

title = "Ion scattering analysis of interfaces",

abstract = "High energy ion scattering, important in the evolving understanding of interfaces and epitaxial growth, has been treated in a number of reviews describing the fundamentals of this technique and its application. A guide to the existing literature and current directions of research is presented.",

author = "Feldman, {Leonard C}",

year = "1984",

doi = "10.1016/0304-3991(84)90106-2",

language = "English",

volume = "14",

pages = "51--54",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Ion scattering analysis of interfaces

AU - Feldman, Leonard C

PY - 1984

Y1 - 1984

N2 - High energy ion scattering, important in the evolving understanding of interfaces and epitaxial growth, has been treated in a number of reviews describing the fundamentals of this technique and its application. A guide to the existing literature and current directions of research is presented.

AB - High energy ion scattering, important in the evolving understanding of interfaces and epitaxial growth, has been treated in a number of reviews describing the fundamentals of this technique and its application. A guide to the existing literature and current directions of research is presented.

UR - http://www.scopus.com/inward/record.url?scp=0021609777&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0021609777&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(84)90106-2

DO - 10.1016/0304-3991(84)90106-2

M3 - Article

AN - SCOPUS:0021609777

VL - 14

SP - 51

EP - 54

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 1-2

ER -