Ion scattering analysis of interfaces

Leonard C Feldman

doi:10.1016/0304-3991(84)90106-2

Ion scattering analysis of interfaces

Leonard C Feldman

Rutgers University

Research output: Contribution to journal › Article

Abstract

High energy ion scattering, important in the evolving understanding of interfaces and epitaxial growth, has been treated in a number of reviews describing the fundamentals of this technique and its application. A guide to the existing literature and current directions of research is presented.

Original language	English
Pages (from-to)	51-54
Number of pages	4
Journal	Ultramicroscopy
Volume	14
Issue number	1-2
DOIs	https://doi.org/10.1016/0304-3991(84)90106-2
Publication status	Published - 1984

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ASJC Scopus subject areas

Materials Science(all)
Instrumentation

Cite this

Feldman, L. C. (1984). Ion scattering analysis of interfaces. Ultramicroscopy, 14(1-2), 51-54. https://doi.org/10.1016/0304-3991(84)90106-2

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10.1016/0304-3991(84)90106-2