Ion-scattering analysis of self-assembled monolayers of silanes on organic semiconductors

Leszek S. Wielunski, S. Katalinic, B. Lee, M. Connors, Eric Garfunkel, Leonard C Feldman, V. Podzorov

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We describe new Rutherford Backscattering Spectroscopy (RBS) measurements to explore the surface chemistry associated with the growth of self-assembled monolayer (SAM) molecules on conducting organic films. The report includes a description of the optimization of both substrates and RBS scattering parameters to appropriately analyze these novel and damage susceptible structures. Our RBS measurements reveal that the final surface stoichiometry is consistent with a specific model of hydrolyzed and crosslinked trichlorosilanes that form a dense two-dimensional network (a monolayer) at the surface of small-molecule organic semiconductors and a bulk SAM network in the case of conjugated polymer films. Organic semiconductors used in this study are thin films of rubrene (a small molecule semiconductor (C42H28)) and poly(3-hexyl)thiophene (P3HT) (a conjugated polymer (C10H18S)n). As a substrate we used a thick (1 μm) film of parylene (a non-conjugated polymer (C8H8)n) deposited on Si (1 0 0) wafers. The SAM molecules used to functionalize the organic semiconductor films are fluoroalkyl trichlorosilane (FTS) (C8(H4F13)SiCl3) and octyltrichlorosilane (OTS) (C8H17SiCl3). Quantitative detection of medium and small-mass elements, such as O, F, Si, S and residual Cl is demonstrated and used to elucidate the surface chemistry in these novel organic systems.

Original languageEnglish
Pages (from-to)1889-1892
Number of pages4
JournalNuclear Inst. and Methods in Physics Research, B
Volume268
Issue number11-12
DOIs
Publication statusPublished - Jun 2010

Fingerprint

Semiconducting organic compounds
organic semiconductors
ion scattering
Self assembled monolayers
Silanes
silanes
Rutherford backscattering spectroscopy
Scattering
backscattering
Molecules
Conjugated polymers
Ions
Surface chemistry
molecules
polymers
chemistry
spectroscopy
Scattering parameters
Thiophene
Substrates

Keywords

  • Doping of organic semiconductors
  • Ion beam assisted decomposition of organic thin film
  • Organic semiconductor thin film
  • Radiation stability of organic films
  • Rutherford Backscattering Spectrometry
  • Surface self-assembly

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Ion-scattering analysis of self-assembled monolayers of silanes on organic semiconductors. / Wielunski, Leszek S.; Katalinic, S.; Lee, B.; Connors, M.; Garfunkel, Eric; Feldman, Leonard C; Podzorov, V.

In: Nuclear Inst. and Methods in Physics Research, B, Vol. 268, No. 11-12, 06.2010, p. 1889-1892.

Research output: Contribution to journalArticle

Wielunski, Leszek S. ; Katalinic, S. ; Lee, B. ; Connors, M. ; Garfunkel, Eric ; Feldman, Leonard C ; Podzorov, V. / Ion-scattering analysis of self-assembled monolayers of silanes on organic semiconductors. In: Nuclear Inst. and Methods in Physics Research, B. 2010 ; Vol. 268, No. 11-12. pp. 1889-1892.
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