Kelvin probe force microscopy as a tool for characterizing chemical sensors

R. Grover, B. McCarthy, Y. Zhao, G. E. Jabbour, D. Sarid, G. M. Laws, B. R. Takulapalli, T. J. Thornton, John Devens Gust

Research output: Contribution to journalArticle

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Abstract

We report on the use of Kelvin probe force microscopy in measuring the shift of the contact potential difference of micron-scale areas. The experimental results provide important information required for understanding and modeling the electrical characteristics of chemically sensitive field-effect transistors (ChemFETs). The temporal evolution in the shift of the contact potential difference of chemically sensitive monolayers of free-base porphyrin and zinc-porphyrin on exposure to pyridine gas was studied and their different behavior observed. The Kelvin probe force microscopy data on nanometer-scale areas were in agreement with those obtained with a conventional Kelvin probe on centimeter-scale areas. The accuracy of the measured shift in contact potential difference upon exposure to trace amounts of gas indicates the utility of Kelvin probe force microscopy as a means to characterize the operation of exposed-gate ChemFETs.

Original languageEnglish
Pages (from-to)3926-3928
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number17
DOIs
Publication statusPublished - Oct 25 2004

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contact potentials
microscopy
probes
sensors
porphyrins
shift
field effect transistors
gases
pyridines
zinc

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Grover, R., McCarthy, B., Zhao, Y., Jabbour, G. E., Sarid, D., Laws, G. M., ... Gust, J. D. (2004). Kelvin probe force microscopy as a tool for characterizing chemical sensors. Applied Physics Letters, 85(17), 3926-3928. https://doi.org/10.1063/1.1810209

Kelvin probe force microscopy as a tool for characterizing chemical sensors. / Grover, R.; McCarthy, B.; Zhao, Y.; Jabbour, G. E.; Sarid, D.; Laws, G. M.; Takulapalli, B. R.; Thornton, T. J.; Gust, John Devens.

In: Applied Physics Letters, Vol. 85, No. 17, 25.10.2004, p. 3926-3928.

Research output: Contribution to journalArticle

Grover, R, McCarthy, B, Zhao, Y, Jabbour, GE, Sarid, D, Laws, GM, Takulapalli, BR, Thornton, TJ & Gust, JD 2004, 'Kelvin probe force microscopy as a tool for characterizing chemical sensors', Applied Physics Letters, vol. 85, no. 17, pp. 3926-3928. https://doi.org/10.1063/1.1810209
Grover R, McCarthy B, Zhao Y, Jabbour GE, Sarid D, Laws GM et al. Kelvin probe force microscopy as a tool for characterizing chemical sensors. Applied Physics Letters. 2004 Oct 25;85(17):3926-3928. https://doi.org/10.1063/1.1810209
Grover, R. ; McCarthy, B. ; Zhao, Y. ; Jabbour, G. E. ; Sarid, D. ; Laws, G. M. ; Takulapalli, B. R. ; Thornton, T. J. ; Gust, John Devens. / Kelvin probe force microscopy as a tool for characterizing chemical sensors. In: Applied Physics Letters. 2004 ; Vol. 85, No. 17. pp. 3926-3928.
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