Local electromechanical response in doped ceria: Rigorous analysis of the phase and amplitude

Denis O. Alikin; Boris N. Slautin; Andrei D. Ushakov; Vladimir Ya Shur; Eran Mishuk; Igor Lubomirsky; Alexander Tselev; Andrei L. Kholkin

doi:10.1109/TDEI.2020.008942

Local electromechanical response in doped ceria: Rigorous analysis of the phase and amplitude

Denis O. Alikin, Boris N. Slautin, Andrei D. Ushakov, Vladimir Ya Shur, Eran Mishuk, Igor Lubomirsky, Alexander Tselev, Andrei L. Kholkin

Weizmann Institute of Science, Israel

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

Characterization of the ionic transport and corresponding electro-elastic deformations in cerium oxide at the nanoscale are important for the understanding of the mechanism of the local response under an external electric field, especially the mechanisms of the 'non-Newnham''-Type giant electrostriction. Here, we introduce a methodological approach to the analysis of signals in the piezoresponse force microscopy/electrochemical strain microscopy allowing decoupling ionic motion, electrostriction, and electrostatic contributions to the electromechanical signals based on a precise analysis of the electromechanical amplitude and phase as a function of temperature, and AC and DC biases. The ionic motion was demonstrated to be hampered in a 30-300°C temperature range, the typical operational range of commercial SPM microscopes. The local electromechanical response was interpreted as a mixture of the electrostatic-force-meditated response and conventional electrostriction.

Original language	English
Article number	9215096
Pages (from-to)	1478-1485
Number of pages	8
Journal	IEEE Transactions on Dielectrics and Electrical Insulation
Volume	27
Issue number	5
DOIs	https://doi.org/10.1109/TDEI.2020.008942
Publication status	Published - Oct 2020

Keywords

cerium oxide
electrochemical strain microscopy
electrostriction
oxygen vacancies
phase

ASJC Scopus subject areas

Electrical and Electronic Engineering

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Local electromechanical response in doped ceria : Rigorous analysis of the phase and amplitude. / Alikin, Denis O.; Slautin, Boris N.; Ushakov, Andrei D.; Shur, Vladimir Ya; Mishuk, Eran; Lubomirsky, Igor; Tselev, Alexander; Kholkin, Andrei L.

In: IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 27, No. 5, 9215096, 10.2020, p. 1478-1485.

Research output: Contribution to journal › Article › peer-review

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title = "Local electromechanical response in doped ceria: Rigorous analysis of the phase and amplitude",

abstract = "Characterization of the ionic transport and corresponding electro-elastic deformations in cerium oxide at the nanoscale are important for the understanding of the mechanism of the local response under an external electric field, especially the mechanisms of the 'non-Newnham''-Type giant electrostriction. Here, we introduce a methodological approach to the analysis of signals in the piezoresponse force microscopy/electrochemical strain microscopy allowing decoupling ionic motion, electrostriction, and electrostatic contributions to the electromechanical signals based on a precise analysis of the electromechanical amplitude and phase as a function of temperature, and AC and DC biases. The ionic motion was demonstrated to be hampered in a 30-300°C temperature range, the typical operational range of commercial SPM microscopes. The local electromechanical response was interpreted as a mixture of the electrostatic-force-meditated response and conventional electrostriction.",

keywords = "cerium oxide, electrochemical strain microscopy, electrostriction, oxygen vacancies, phase",

author = "Alikin, {Denis O.} and Slautin, {Boris N.} and Ushakov, {Andrei D.} and Shur, {Vladimir Ya} and Eran Mishuk and Igor Lubomirsky and Alexander Tselev and Kholkin, {Andrei L.}",

note = "Funding Information: The equipment of the Ural Center for Shared Use {\textquoteleft}Modern Nanotechnology{\textquoteright} UrFU was used. The research was supported by the Ministry of Education and Science of the Russian Federation Agreement no. 02.A03.21.0006. In part, this work was developed within the scope of the project CICECO-Aveiro Institute of Materials, UIDB/50011/2020 & UIDP/50011/2020, financed by national funds through the FCT/MEC and when appropriate co-financed by FEDER under the PT2020 Partnership Agreement.",

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AU - Mishuk, Eran

AU - Lubomirsky, Igor

AU - Tselev, Alexander

AU - Kholkin, Andrei L.

N1 - Funding Information: The equipment of the Ural Center for Shared Use ‘Modern Nanotechnology’ UrFU was used. The research was supported by the Ministry of Education and Science of the Russian Federation Agreement no. 02.A03.21.0006. In part, this work was developed within the scope of the project CICECO-Aveiro Institute of Materials, UIDB/50011/2020 & UIDP/50011/2020, financed by national funds through the FCT/MEC and when appropriate co-financed by FEDER under the PT2020 Partnership Agreement.

PY - 2020/10

Y1 - 2020/10

N2 - Characterization of the ionic transport and corresponding electro-elastic deformations in cerium oxide at the nanoscale are important for the understanding of the mechanism of the local response under an external electric field, especially the mechanisms of the 'non-Newnham''-Type giant electrostriction. Here, we introduce a methodological approach to the analysis of signals in the piezoresponse force microscopy/electrochemical strain microscopy allowing decoupling ionic motion, electrostriction, and electrostatic contributions to the electromechanical signals based on a precise analysis of the electromechanical amplitude and phase as a function of temperature, and AC and DC biases. The ionic motion was demonstrated to be hampered in a 30-300°C temperature range, the typical operational range of commercial SPM microscopes. The local electromechanical response was interpreted as a mixture of the electrostatic-force-meditated response and conventional electrostriction.

AB - Characterization of the ionic transport and corresponding electro-elastic deformations in cerium oxide at the nanoscale are important for the understanding of the mechanism of the local response under an external electric field, especially the mechanisms of the 'non-Newnham''-Type giant electrostriction. Here, we introduce a methodological approach to the analysis of signals in the piezoresponse force microscopy/electrochemical strain microscopy allowing decoupling ionic motion, electrostriction, and electrostatic contributions to the electromechanical signals based on a precise analysis of the electromechanical amplitude and phase as a function of temperature, and AC and DC biases. The ionic motion was demonstrated to be hampered in a 30-300°C temperature range, the typical operational range of commercial SPM microscopes. The local electromechanical response was interpreted as a mixture of the electrostatic-force-meditated response and conventional electrostriction.

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Local electromechanical response in doped ceria: Rigorous analysis of the phase and amplitude

Abstract

Keywords

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