Abstract
This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.
Original language | English |
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Pages (from-to) | 30-34 |
Number of pages | 5 |
Journal | MRS Bulletin |
Volume | 12 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1987 |
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Physical and Theoretical Chemistry