Abstract
This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.
| Original language | English |
|---|---|
| Pages (from-to) | 30-34 |
| Number of pages | 5 |
| Journal | MRS Bulletin |
| Volume | 12 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1987 |
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Physical and Theoretical Chemistry
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Cite this
Gossmann, H. J., & Feldman, L. C. (1987). Materials Analysis With High Energy Ion Beams Part II: Channeling and Other Techniques. MRS Bulletin, 12(6), 30-34. https://doi.org/10.1557/S0883769400067191