Materials Analysis With High Energy Ion Beams Part II: Channeling and Other Techniques

H. J. Gossmann; Leonard C Feldman

doi:10.1557/S0883769400067191

Materials Analysis With High Energy Ion Beams Part II: Channeling and Other Techniques

H. J. Gossmann, Leonard C Feldman

Rutgers University

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.

Original language	English
Pages (from-to)	30-34
Number of pages	5
Journal	MRS Bulletin
Volume	12
Issue number	6
DOIs	https://doi.org/10.1557/S0883769400067191
Publication status	Published - 1987

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Physical and Theoretical Chemistry

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title = "Materials Analysis With High Energy Ion Beams Part II: Channeling and Other Techniques",

abstract = "This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.",

author = "Gossmann, {H. J.} and Feldman, {Leonard C}",

year = "1987",

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