Materials Analysis With High Energy Ion Beams Part II: Channeling and Other Techniques

H. J. Gossmann, Leonard C Feldman

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.

Original languageEnglish
Pages (from-to)30-34
Number of pages5
JournalMRS Bulletin
Volume12
Issue number6
DOIs
Publication statusPublished - 1987

Fingerprint

Nuclear reactions
light elements
nuclear reactions
Ion beams
ion beams
Scattering
Crystalline materials
X rays
Defects
defects
scattering
x rays
energy

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry

Cite this

Materials Analysis With High Energy Ion Beams Part II : Channeling and Other Techniques. / Gossmann, H. J.; Feldman, Leonard C.

In: MRS Bulletin, Vol. 12, No. 6, 1987, p. 30-34.

Research output: Contribution to journalArticle

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