Materials Analysis With High Energy Ion Beams Part II: Channeling and Other Techniques

H. J. Gossmann, Leonard C Feldman

Research output: Contribution to journalArticle

3 Citations (Scopus)


This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.

Original languageEnglish
Pages (from-to)30-34
Number of pages5
JournalMRS Bulletin
Issue number6
Publication statusPublished - 1987


ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry

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