Measurement of the energy-band relations of stabilized Si photoanodes using operando ambient pressure X-ray photoelectron spectroscopy

M. H. Richter, M. F. Lichterman, S. Hu, E. J. Crumlin, T. Mayer, S. Axnanda, M. Favaro, W. Drisdell, Z. Hussain, B. S. Brunschwig, Nathan S Lewis, Z. Liu, H. J. Lewerenz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

The energy-band relations and electronic properties for the lightabsorber/ protection-layer stack of TiO2-stabilized Si photoanodes have been determined by ambient pressure x-ray synchrotron radiation photoelectron spectroscopy under an applied potential (operando), from single core-level emission lines. The experiments have also been complemented with laboratory-based monochromatic XPS data. Electrochemical parameters are additionally derived directly from x-ray photoemission data, and a method is presented to derive interface-state densities from such operando data.

Original languageEnglish
Title of host publicationECS Transactions
PublisherElectrochemical Society Inc.
Pages105-113
Number of pages9
Volume66
Edition6
ISBN (Print)9781607685395
DOIs
Publication statusPublished - 2015
EventSymposium on Processes at the Semiconductor Solution Interface 6 - 227th ECS Meeting - Chicago, United States
Duration: May 24 2015May 28 2015

Other

OtherSymposium on Processes at the Semiconductor Solution Interface 6 - 227th ECS Meeting
CountryUnited States
CityChicago
Period5/24/155/28/15

Fingerprint

Band structure
X ray photoelectron spectroscopy
X rays
Core levels
Interface states
Photoemission
Photoelectron spectroscopy
Synchrotron radiation
Electronic properties
Experiments

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Richter, M. H., Lichterman, M. F., Hu, S., Crumlin, E. J., Mayer, T., Axnanda, S., ... Lewerenz, H. J. (2015). Measurement of the energy-band relations of stabilized Si photoanodes using operando ambient pressure X-ray photoelectron spectroscopy. In ECS Transactions (6 ed., Vol. 66, pp. 105-113). Electrochemical Society Inc.. https://doi.org/10.1149/06606.0105ecst

Measurement of the energy-band relations of stabilized Si photoanodes using operando ambient pressure X-ray photoelectron spectroscopy. / Richter, M. H.; Lichterman, M. F.; Hu, S.; Crumlin, E. J.; Mayer, T.; Axnanda, S.; Favaro, M.; Drisdell, W.; Hussain, Z.; Brunschwig, B. S.; Lewis, Nathan S; Liu, Z.; Lewerenz, H. J.

ECS Transactions. Vol. 66 6. ed. Electrochemical Society Inc., 2015. p. 105-113.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Richter, MH, Lichterman, MF, Hu, S, Crumlin, EJ, Mayer, T, Axnanda, S, Favaro, M, Drisdell, W, Hussain, Z, Brunschwig, BS, Lewis, NS, Liu, Z & Lewerenz, HJ 2015, Measurement of the energy-band relations of stabilized Si photoanodes using operando ambient pressure X-ray photoelectron spectroscopy. in ECS Transactions. 6 edn, vol. 66, Electrochemical Society Inc., pp. 105-113, Symposium on Processes at the Semiconductor Solution Interface 6 - 227th ECS Meeting, Chicago, United States, 5/24/15. https://doi.org/10.1149/06606.0105ecst
Richter MH, Lichterman MF, Hu S, Crumlin EJ, Mayer T, Axnanda S et al. Measurement of the energy-band relations of stabilized Si photoanodes using operando ambient pressure X-ray photoelectron spectroscopy. In ECS Transactions. 6 ed. Vol. 66. Electrochemical Society Inc. 2015. p. 105-113 https://doi.org/10.1149/06606.0105ecst
Richter, M. H. ; Lichterman, M. F. ; Hu, S. ; Crumlin, E. J. ; Mayer, T. ; Axnanda, S. ; Favaro, M. ; Drisdell, W. ; Hussain, Z. ; Brunschwig, B. S. ; Lewis, Nathan S ; Liu, Z. ; Lewerenz, H. J. / Measurement of the energy-band relations of stabilized Si photoanodes using operando ambient pressure X-ray photoelectron spectroscopy. ECS Transactions. Vol. 66 6. ed. Electrochemical Society Inc., 2015. pp. 105-113
@inproceedings{98c45402a3fa48539cc814e4f5a5df50,
title = "Measurement of the energy-band relations of stabilized Si photoanodes using operando ambient pressure X-ray photoelectron spectroscopy",
abstract = "The energy-band relations and electronic properties for the lightabsorber/ protection-layer stack of TiO2-stabilized Si photoanodes have been determined by ambient pressure x-ray synchrotron radiation photoelectron spectroscopy under an applied potential (operando), from single core-level emission lines. The experiments have also been complemented with laboratory-based monochromatic XPS data. Electrochemical parameters are additionally derived directly from x-ray photoemission data, and a method is presented to derive interface-state densities from such operando data.",
author = "Richter, {M. H.} and Lichterman, {M. F.} and S. Hu and Crumlin, {E. J.} and T. Mayer and S. Axnanda and M. Favaro and W. Drisdell and Z. Hussain and Brunschwig, {B. S.} and Lewis, {Nathan S} and Z. Liu and Lewerenz, {H. J.}",
year = "2015",
doi = "10.1149/06606.0105ecst",
language = "English",
isbn = "9781607685395",
volume = "66",
pages = "105--113",
booktitle = "ECS Transactions",
publisher = "Electrochemical Society Inc.",
edition = "6",

}

TY - GEN

T1 - Measurement of the energy-band relations of stabilized Si photoanodes using operando ambient pressure X-ray photoelectron spectroscopy

AU - Richter, M. H.

AU - Lichterman, M. F.

AU - Hu, S.

AU - Crumlin, E. J.

AU - Mayer, T.

AU - Axnanda, S.

AU - Favaro, M.

AU - Drisdell, W.

AU - Hussain, Z.

AU - Brunschwig, B. S.

AU - Lewis, Nathan S

AU - Liu, Z.

AU - Lewerenz, H. J.

PY - 2015

Y1 - 2015

N2 - The energy-band relations and electronic properties for the lightabsorber/ protection-layer stack of TiO2-stabilized Si photoanodes have been determined by ambient pressure x-ray synchrotron radiation photoelectron spectroscopy under an applied potential (operando), from single core-level emission lines. The experiments have also been complemented with laboratory-based monochromatic XPS data. Electrochemical parameters are additionally derived directly from x-ray photoemission data, and a method is presented to derive interface-state densities from such operando data.

AB - The energy-band relations and electronic properties for the lightabsorber/ protection-layer stack of TiO2-stabilized Si photoanodes have been determined by ambient pressure x-ray synchrotron radiation photoelectron spectroscopy under an applied potential (operando), from single core-level emission lines. The experiments have also been complemented with laboratory-based monochromatic XPS data. Electrochemical parameters are additionally derived directly from x-ray photoemission data, and a method is presented to derive interface-state densities from such operando data.

UR - http://www.scopus.com/inward/record.url?scp=84931068447&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84931068447&partnerID=8YFLogxK

U2 - 10.1149/06606.0105ecst

DO - 10.1149/06606.0105ecst

M3 - Conference contribution

SN - 9781607685395

VL - 66

SP - 105

EP - 113

BT - ECS Transactions

PB - Electrochemical Society Inc.

ER -