Measurement of the energy-band relations of stabilized Si photoanodes using operando ambient pressure X-ray photoelectron spectroscopy

M. H. Richter, M. F. Lichterman, S. Hu, E. J. Crumlin, T. Mayer, S. Axnanda, M. Favaro, W. Drisdell, Z. Hussain, B. S. Brunschwig, N. S. Lewis, Z. Liu, H. J. Lewerenz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

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Engineering & Materials Science