Measuring time profiles of ultraweak ultrashort pulses by time domain superresolution

O. Schwartz, O. Raz, O. Katz, N. Dudovich, D. Oron

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate an optical nonlinearity free ultrashort pulse characterization technique relying on spectral component localization in time domain. Ultraweak pulses in NIR to XUV range can be characterized with resolution depending only on integration time.

Original languageEnglish
Title of host publicationInternational Conference on Ultrafast Phenomena, UP 2010
Publication statusPublished - Dec 1 2010
EventInternational Conference on Ultrafast Phenomena, UP 2010 - Snowmass Village, CO, United States
Duration: Jul 18 2010Jul 23 2010

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherInternational Conference on Ultrafast Phenomena, UP 2010
CountryUnited States
CitySnowmass Village, CO
Period7/18/107/23/10

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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    Schwartz, O., Raz, O., Katz, O., Dudovich, N., & Oron, D. (2010). Measuring time profiles of ultraweak ultrashort pulses by time domain superresolution. In International Conference on Ultrafast Phenomena, UP 2010 (Optics InfoBase Conference Papers).