Micro-Scale Device—An Alternative Route for Studying the Intrinsic Properties of Solid-State Materials: The Case of Semiconducting TaGeIr

I. Antonyshyn, F. R. Wagner, M. Bobnar, O. Sichevych, U. Burkhardt, M. Schmidt, M. König, K. Poeppelmeier, A. P. Mackenzie, E. Svanidze, Yu Grin

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Chemical Compounds

Engineering & Materials Science