Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film

M. Zhang, X. L. Ma, D. X. Li, S. J. Xie, Robert P. H. Chang

Research output: Contribution to journalArticle

Abstract

Perovskite-based BaNb0.2Ti0.8O3 (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO3 (0 0 1) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb0.2Ti0.8O3 film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains.

Original languageEnglish
Pages (from-to)756-761
Number of pages6
JournalMaterials Chemistry and Physics
Volume112
Issue number3
DOIs
Publication statusPublished - Dec 20 2008

Fingerprint

Microanalysis
microanalysis
Imaging techniques
Thin films
microstructure
Microstructure
Film growth
thin films
Molecular beam epitaxy
Perovskite
Electron microscopes
Scanning
X rays
Electrons
Lasers
Substrates
diffusivity
molecular beam epitaxy
electron microscopes
laser beams

Keywords

  • Defects
  • Interface structure
  • Microstructure characterization
  • Orientation relationship
  • Perovskite thin films
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film. / Zhang, M.; Ma, X. L.; Li, D. X.; Xie, S. J.; Chang, Robert P. H.

In: Materials Chemistry and Physics, Vol. 112, No. 3, 20.12.2008, p. 756-761.

Research output: Contribution to journalArticle

Zhang, M. ; Ma, X. L. ; Li, D. X. ; Xie, S. J. ; Chang, Robert P. H. / Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film. In: Materials Chemistry and Physics. 2008 ; Vol. 112, No. 3. pp. 756-761.
@article{fbd0e614a90744869e9a944a1fdcd3f2,
title = "Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film",
abstract = "Perovskite-based BaNb0.2Ti0.8O3 (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO3 (0 0 1) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb0.2Ti0.8O3 film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains.",
keywords = "Defects, Interface structure, Microstructure characterization, Orientation relationship, Perovskite thin films, Transmission electron microscopy",
author = "M. Zhang and Ma, {X. L.} and Li, {D. X.} and Xie, {S. J.} and Chang, {Robert P. H.}",
year = "2008",
month = "12",
day = "20",
doi = "10.1016/j.matchemphys.2008.06.033",
language = "English",
volume = "112",
pages = "756--761",
journal = "Materials Chemistry and Physics",
issn = "0254-0584",
publisher = "Elsevier BV",
number = "3",

}

TY - JOUR

T1 - Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film

AU - Zhang, M.

AU - Ma, X. L.

AU - Li, D. X.

AU - Xie, S. J.

AU - Chang, Robert P. H.

PY - 2008/12/20

Y1 - 2008/12/20

N2 - Perovskite-based BaNb0.2Ti0.8O3 (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO3 (0 0 1) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb0.2Ti0.8O3 film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains.

AB - Perovskite-based BaNb0.2Ti0.8O3 (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO3 (0 0 1) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb0.2Ti0.8O3 film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains.

KW - Defects

KW - Interface structure

KW - Microstructure characterization

KW - Orientation relationship

KW - Perovskite thin films

KW - Transmission electron microscopy

UR - http://www.scopus.com/inward/record.url?scp=55749090047&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=55749090047&partnerID=8YFLogxK

U2 - 10.1016/j.matchemphys.2008.06.033

DO - 10.1016/j.matchemphys.2008.06.033

M3 - Article

VL - 112

SP - 756

EP - 761

JO - Materials Chemistry and Physics

JF - Materials Chemistry and Physics

SN - 0254-0584

IS - 3

ER -