Microstructure-electrical property relationships in cement-based materials

R. A. Olson, G. M. Moss, B. J. Christensen, J. D. Shane, R. T. Coverdale, E. J. Garboczi, H. M. Jennings, Thomas O Mason

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)


A recent progress on the application of impedance spectroscopy (IS) to the study of microstructure and transport in cement-based materials has been reported. With the IS spectrum, bulk resistance could be determined. The high values of the relative dielectric constant result of the microstructure inducing dielectric amplification. The role of large capillary pores in the dielectric amplification in young pastes are confirmed by solvent exchange experiments coupled with digital-image-based computer modeling. When the conductivities (εr) and relative dielectric constants (εr) of ordinary portland cement (OPC) pastes were monitored during cooling and solvent exchange with isopropanol and methanol, dramatic decreases in and as well as a secondary dielectric amplification were observed. By comparing the dielectric behavior of methanol-exchanged OPC pastes to isopropanol-exchanged OPC pastes, additional insight into the variable nature of the C-S-H microstructure was achieved.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Number of pages10
Publication statusPublished - 1995
EventProceedings of the 1994 MRS Fall Meeting - Boston, MA, USA
Duration: Nov 28 1994Nov 30 1994


OtherProceedings of the 1994 MRS Fall Meeting
CityBoston, MA, USA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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