Microstructure-electrical property relationships in cement-based materials

R. A. Olson; G. M. Moss; B. J. Christensen; J. D. Shane; R. T. Coverdale; E. J. Garboczi; H. M. Jennings; Thomas O Mason

Microstructure-electrical property relationships in cement-based materials

R. A. Olson, G. M. Moss, B. J. Christensen, J. D. Shane, R. T. Coverdale, E. J. Garboczi, H. M. Jennings, Thomas O Mason

Northwestern University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Citations (Scopus)

Abstract

A recent progress on the application of impedance spectroscopy (IS) to the study of microstructure and transport in cement-based materials has been reported. With the IS spectrum, bulk resistance could be determined. The high values of the relative dielectric constant result of the microstructure inducing dielectric amplification. The role of large capillary pores in the dielectric amplification in young pastes are confirmed by solvent exchange experiments coupled with digital-image-based computer modeling. When the conductivities (ε_r) and relative dielectric constants (ε_r) of ordinary portland cement (OPC) pastes were monitored during cooling and solvent exchange with isopropanol and methanol, dramatic decreases in and as well as a secondary dielectric amplification were observed. By comparing the dielectric behavior of methanol-exchanged OPC pastes to isopropanol-exchanged OPC pastes, additional insight into the variable nature of the C-S-H microstructure was achieved.

Original language	English
Title of host publication	Materials Research Society Symposium - Proceedings
Publisher	Materials Research Society
Pages	255-264
Number of pages	10
Volume	370
Publication status	Published - 1995
Event	Proceedings of the 1994 MRS Fall Meeting - Boston, MA, USA Duration: Nov 28 1994 → Nov 30 1994

Other

Other	Proceedings of the 1994 MRS Fall Meeting
City	Boston, MA, USA
Period	11/28/94 → 11/30/94

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

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Olson, R. A., Moss, G. M., Christensen, B. J., Shane, J. D., Coverdale, R. T., Garboczi, E. J., Jennings, H. M., & Mason, T. O. (1995). Microstructure-electrical property relationships in cement-based materials. In Materials Research Society Symposium - Proceedings (Vol. 370, pp. 255-264). Materials Research Society.

Microstructure-electrical property relationships in cement-based materials. / Olson, R. A.; Moss, G. M.; Christensen, B. J.; Shane, J. D.; Coverdale, R. T.; Garboczi, E. J.; Jennings, H. M.; Mason, Thomas O.

Materials Research Society Symposium - Proceedings. Vol. 370 Materials Research Society, 1995. p. 255-264.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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abstract = "A recent progress on the application of impedance spectroscopy (IS) to the study of microstructure and transport in cement-based materials has been reported. With the IS spectrum, bulk resistance could be determined. The high values of the relative dielectric constant result of the microstructure inducing dielectric amplification. The role of large capillary pores in the dielectric amplification in young pastes are confirmed by solvent exchange experiments coupled with digital-image-based computer modeling. When the conductivities (εr) and relative dielectric constants (εr) of ordinary portland cement (OPC) pastes were monitored during cooling and solvent exchange with isopropanol and methanol, dramatic decreases in and as well as a secondary dielectric amplification were observed. By comparing the dielectric behavior of methanol-exchanged OPC pastes to isopropanol-exchanged OPC pastes, additional insight into the variable nature of the C-S-H microstructure was achieved.",

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