Microvisualization of structural features and ion electroinsertion behavior of patterned WO3 thin films via integrated optical and atomic force microscopies

Keith J. Stevenson, Joseph T Hupp

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

A versatile method for preparing templated WO3 thin films on transparent, conductive indium tin oxide (ITO) is demonstrated. In addition, the patterned thin films serve as quantitative experimental platforms for the study of interfacial ion transfer reactions. The differential electroinsertion/electrochromic activity can be correlated with structural characteristics of patterned WO3 thin films. The influence of structural features such as film morphology, crystallinity and film thickness on the kinetic and optical electroinsertion behavior of redox-active metal oxides, specifically for MoO3, using integrated `microvisualization' approach is presented.

Original languageEnglish
Pages (from-to)497-500
Number of pages4
JournalElectrochemical and Solid-State Letters
Volume2
Issue number10
DOIs
Publication statusPublished - Oct 1999

Fingerprint

Atomic force microscopy
atomic force microscopy
Ions
Thin films
thin films
ions
Tin oxides
indium oxides
Indium
Oxides
tin oxides
metal oxides
Film thickness
crystallinity
film thickness
platforms
Metals
Kinetics
kinetics
Oxidation-Reduction

ASJC Scopus subject areas

  • Electrochemistry
  • Materials Science(all)

Cite this

@article{d7d63aef0b6f49c6bae947e9b763bf37,
title = "Microvisualization of structural features and ion electroinsertion behavior of patterned WO3 thin films via integrated optical and atomic force microscopies",
abstract = "A versatile method for preparing templated WO3 thin films on transparent, conductive indium tin oxide (ITO) is demonstrated. In addition, the patterned thin films serve as quantitative experimental platforms for the study of interfacial ion transfer reactions. The differential electroinsertion/electrochromic activity can be correlated with structural characteristics of patterned WO3 thin films. The influence of structural features such as film morphology, crystallinity and film thickness on the kinetic and optical electroinsertion behavior of redox-active metal oxides, specifically for MoO3, using integrated `microvisualization' approach is presented.",
author = "Stevenson, {Keith J.} and Hupp, {Joseph T}",
year = "1999",
month = "10",
doi = "10.1149/1.1390882",
language = "English",
volume = "2",
pages = "497--500",
journal = "Electrochemical and Solid-State Letters",
issn = "1099-0062",
publisher = "Electrochemical Society, Inc.",
number = "10",

}

TY - JOUR

T1 - Microvisualization of structural features and ion electroinsertion behavior of patterned WO3 thin films via integrated optical and atomic force microscopies

AU - Stevenson, Keith J.

AU - Hupp, Joseph T

PY - 1999/10

Y1 - 1999/10

N2 - A versatile method for preparing templated WO3 thin films on transparent, conductive indium tin oxide (ITO) is demonstrated. In addition, the patterned thin films serve as quantitative experimental platforms for the study of interfacial ion transfer reactions. The differential electroinsertion/electrochromic activity can be correlated with structural characteristics of patterned WO3 thin films. The influence of structural features such as film morphology, crystallinity and film thickness on the kinetic and optical electroinsertion behavior of redox-active metal oxides, specifically for MoO3, using integrated `microvisualization' approach is presented.

AB - A versatile method for preparing templated WO3 thin films on transparent, conductive indium tin oxide (ITO) is demonstrated. In addition, the patterned thin films serve as quantitative experimental platforms for the study of interfacial ion transfer reactions. The differential electroinsertion/electrochromic activity can be correlated with structural characteristics of patterned WO3 thin films. The influence of structural features such as film morphology, crystallinity and film thickness on the kinetic and optical electroinsertion behavior of redox-active metal oxides, specifically for MoO3, using integrated `microvisualization' approach is presented.

UR - http://www.scopus.com/inward/record.url?scp=0032594226&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032594226&partnerID=8YFLogxK

U2 - 10.1149/1.1390882

DO - 10.1149/1.1390882

M3 - Article

VL - 2

SP - 497

EP - 500

JO - Electrochemical and Solid-State Letters

JF - Electrochemical and Solid-State Letters

SN - 1099-0062

IS - 10

ER -