Monitoring and analyzing nonlinear dynamics in atomic force microscopy

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Abstract

The nonlinear dynamics that have been predicted for intermittent contact mode Atomic Force Microscopy (AFM) in the strongly repulsive tip-sample interaction regime is analyzed and monitored. The experimental apparatus detects the raw cantilever response at all frequencies with an analog-to-digital converter. In the initial attractive regime of the tip-sample interaction, the cantilever oscillation amplitude decreases in a linear fashion. As the tip-sample interaction transitions to the repulsive regime, the raw cantilever oscillation data undergoes an abrupt change that includes more complicated substructure and nonlinear features. In this repulsive tip-sample interaction regime, many of the higher harmonics and subharmonics are greater than 10% of the amplitude at the driving frequency. The nonlinearities in other frequency-dependent AFM technique can similarly be characterized by monitoring and analyzing the entire frequency response, as opposed to only locking in to the driving frequency.

Original languageEnglish
Pages (from-to)1122-1124
Number of pages3
JournalSmall
Volume2
Issue number10
DOIs
Publication statusPublished - Oct 1 2006

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Keywords

  • Atomic force microscopy
  • Nanomanipulation
  • Nonlinear dynamics
  • Tapping mode

ASJC Scopus subject areas

  • Biotechnology
  • Biomaterials
  • Chemistry(all)
  • Materials Science(all)

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