Monolayer to multilayer nanostructural evolution in N type oligothiphenes: Implications for OFET performance

Geetha R. Dholakia, Antonio Facchetti, Tobin J. Marks

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present the evolution in the growth morphology and molecular orientation of an n-type fluorocarbon-substituted quaterthiophene DFH-4T by scanning tunneling microscopy, as the film thickness is increased from one monolayer to many multilayers. In parallel we measured the performance of top vs bottom contact DFH-4T organic field effect transistors and show a three orders of magnitude difference in performance. By correlating the observed nanostructure with the device properties, we show that the superior performance of top contact devices is due to the better molecular orientation and alignment in multilayer films with respect to the contacts.

Original languageEnglish
Title of host publication2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings
Pages530-533
Number of pages4
Publication statusPublished - Aug 23 2007
Event2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007 - Santa Clara, CA, United States
Duration: May 20 2007May 24 2007

Publication series

Name2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings
Volume4

Other

Other2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007
CountryUnited States
CitySanta Clara, CA
Period5/20/075/24/07

Keywords

  • Monolayer
  • Organic FETs
  • Scanning tunneling microscopy
  • Thiophenes

ASJC Scopus subject areas

  • Mechanical Engineering

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    Dholakia, G. R., Facchetti, A., & Marks, T. J. (2007). Monolayer to multilayer nanostructural evolution in N type oligothiphenes: Implications for OFET performance. In 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings (pp. 530-533). (2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings; Vol. 4).