Monolayer vibrational spectroscopy by infrared-visible sum generation at metal and semiconductor surfaces

Alex Harris, C. E D Chidsey, N. J. Levinos, D. N. Loiacono

Research output: Contribution to journalArticle

192 Citations (Scopus)

Abstract

IR-visible sum generation spectroscopy, an interface-selective probe of molecular vibrations, is used to obtain vibrational spectra of molecular monolayers on metal and semiconductor surfaces. The spectra obey electric dipole selection rules: vibrational modes must be both Raman and infrared active to show sum frequency resonances. The orientation of molecules at the interface can be determined by interference between the resonant molecular signal and a substrate background signal. Sum generation is also observed at a buried interface in the absence of a dielectric discontinuity, suggesting uses at buried molecular structures such as polymer-polymer interfaces.

Original languageEnglish
Pages (from-to)350-356
Number of pages7
JournalChemical Physics Letters
Volume141
Issue number4
DOIs
Publication statusPublished - Nov 13 1987

Fingerprint

Vibrational spectroscopy
metal surfaces
Monolayers
Metals
Semiconductor materials
Infrared radiation
Polymers
Molecular vibrations
spectroscopy
Vibrational spectra
Molecular structure
polymers
Spectroscopy
vibrational spectra
electric dipoles
vibration mode
discontinuity
Molecules
molecular structure
Substrates

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics
  • Surfaces and Interfaces

Cite this

Monolayer vibrational spectroscopy by infrared-visible sum generation at metal and semiconductor surfaces. / Harris, Alex; Chidsey, C. E D; Levinos, N. J.; Loiacono, D. N.

In: Chemical Physics Letters, Vol. 141, No. 4, 13.11.1987, p. 350-356.

Research output: Contribution to journalArticle

Harris, Alex ; Chidsey, C. E D ; Levinos, N. J. ; Loiacono, D. N. / Monolayer vibrational spectroscopy by infrared-visible sum generation at metal and semiconductor surfaces. In: Chemical Physics Letters. 1987 ; Vol. 141, No. 4. pp. 350-356.
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